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Lookup NU author(s): Professor Patrick Briddon
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First-principles density-functional calculations of the band structure and wave functions around narrow X-like inclusions in 4H-SiC have been performed. X-like inclusions of various thicknesses, corresponding to two, three, and four stacking faults in neighbouring basal planes, have been investigated. The results for the number of bound states in the inclusion, their energies, and wave functions are well described by a simple one-dimensional quantum-well square potential. The quantum-well property of these inclusions suggests that X-like regions in 4H-SiC are efficient planar traps for conduction band electrons.
Author(s): Iwata H, Lindefelt U, Oberg S, Briddon PR
Editor(s): Yoshida, S., Nishino, S., Harima, H., Kimoto, T.
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: International Conference on Silicon Carbide and Related Materials
Year of Conference: 2002
Pages: 533-536
ISSN: 0255-5476
Publisher: Trans Tech Publications Ltd.
URL: http://dx.doi.org/10.4028/www.scientific.net/MSF.389-393.533
DOI: 10.4028/www.scientific.net/MSF.389-393.533
Library holdings: Search Newcastle University Library for this item
Series Title: Materials Science Forum
ISBN: 9780878498949