Browse by author
Lookup NU author(s): Dr Michele Pozzi
Full text for this publication is not currently held within this repository. Alternative links are provided below where available.
The electrical resistance of Ni/sub 50/Ti/sub 30/Hf/sub 20/ and Ni/sub 50/Ti/sub 40.5/Hf/sub 9.5/ alloys during stress assisted two way memory effect was investigated with the aim to deduce the relationship between electrical resistance and deformation across the transformation range. Results show an almost linear relationship although a crossing point between increasing and decreasing deformation may compromise the use of these alloys in actuators. (6 References). ISBN 0255-5476
Author(s): Pozzi M; Airoldi G; Piredda S; Shelyakov AV
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: International Symposium and Exhibition on Shape Memory Materials (SMM)
Year of Conference: 1999
Publisher: Trans Tech Publications Ltd
Notes: International Symposium and Exhibition on Shape Memory Materials (SMM '99). Kanazawa, Japan. 19-21 May 1999.
Temperature 8.23E+02 K Temperature 2.73E+02 to 5.73E+02 K
Library holdings: Search Newcastle University Library for this item
Series Title: Materials Science Forum