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Lookup NU author(s): Professor Nick Wright
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Author(s): Black K, Kelly K, Wright N
Editor(s):
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: Twenty First Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Year of Conference: 2005
Pages: 223-228
ISSN: 1065-2221
Publisher: IEEE
URL: http://dx.doi.org/10.1109/STHERM.2005.1412183
DOI: 10.1109/STHERM.2005.1412183
Library holdings: Search Newcastle University Library for this item
ISBN: 0780389859
