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Modeling subthreshold leakage and thermal stability in a production life test environment

Lookup NU author(s): Professor Nick Wright


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Publication metadata

Author(s): Black K, Kelly K, Wright N


Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Twenty First Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Year of Conference: 2005

Pages: 223-228

ISSN: 1065-2221

Publisher: IEEE


DOI: 10.1109/STHERM.2005.1412183

Library holdings: Search Newcastle University Library for this item

ISBN: 0780389859