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The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

Stress analysis of B doped silicon bridges and cantilever structures by Raman spectroscopy

Lookup NU author(s): Dr John HedleyORCiD

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Publication metadata

Author(s): Lourenco MA, Gardiner DJ, Bowden M, Hedley J, Wood D

Publication type: Article

Publication status: Published

Journal: Journal of Materials Science Letters

Year: 2000

Volume: 19

Issue: 9

Pages: 767-769

ISSN (print): 0261-8028

ISSN (electronic): 1573-4811

Publisher: Kluwer Academic Publishers

URL: http://dx.doi.org/10.1023/A:1006752321075

DOI: 10.1023/A:1006752321075


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