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Lookup NU author(s): Emeritus Professor Derek Thompson
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High resolution electron microscopy has been used to examine the nanoscale structure of the related B and I-w phases in Y and Er SiAlONs. B-phase was found to consist of nanoscale domains with a lower symmetry than the average hexagonal symmetry. The monoclinic cell of I-w can be clearly imaged by HREM and work is in progress to use these images in the determination of atomic positions in the unit cell. One consequence of the ordered structure of I-w is the possibility of forming domain boundaries, and two of the three possible types of domain boundaries have now been imaged using HREM.
Author(s): MacLaren I, Falk LKL, Menke Y, Diaz A, Hampshire S, Parmentier J, Thompson DP
Editor(s): Kiely, C.K.
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: Biennial Meeting of the Electron Microscopy and Analysis Group of the Institute of Physics (EMAG)
Year of Conference: 1999
Pages: 153-156
ISSN: 0951-3248
Publisher: Taylor & Francis
Library holdings: Search Newcastle University Library for this item
Series Title: Electron Microscopy and Analysis
ISBN: 9780750305778