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A reduced approach for modelling the influence of nanoclusters and {113} defects on transient enhanced diffusion

Lookup NU author(s): Professor Nick Cowern


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Publication metadata

Author(s): Cowern NEB; Stiebel D; Pichler P

Publication type: Article

Publication status: Published

Journal: Applied Physics Letters

Year: 2001

Volume: 79

Issue: 16

Pages: 2654-2656

ISSN (print): 0003-6951

ISSN (electronic): 1077-3118

Publisher: American Institute of Physics


DOI: 10.1063/1.1406147


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