ePrints

A reduced approach for modelling the influence of nanoclusters and {113} defects on transient enhanced diffusion

Lookup NU author(s): Professor Nick Cowern

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Cowern NEB; Stiebel D; Pichler P

Publication type: Article

Publication status: Published

Journal: Applied Physics Letters

Year: 2001

Volume: 79

Issue: 16

Pages: 2654-2656

ISSN (print): 0003-6951

ISSN (electronic): 1077-3118

Publisher: American Institute of Physics

URL: http://dx.doi.org/10.1063/1.1406147

DOI: 10.1063/1.1406147

Altmetrics

Share