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Non-invasive Imaging of Stem Cells by Scanning Ion Conductance Microscopy: Future Perspective

Lookup NU author(s): Petra Stojkovic, Professor Lyle Armstrong, Professor Majlinda Lako, Professor Miodrag Stojkovic

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Abstract

The most valuable property of stem cells (SCs) is their potential to differentiate into many or all cell types of the body. So far, monitoring SC differentiation has only been possible after cells were fixed or destroyed during sample preparation. It is, however, important to develop nondestructive methods of monitoring SCs. Scanning ion conductance microscopy (SICM) is a unique imaging technique that uses similar principles to the atomic force microscope, but with a pipette for the probe. This allows scanning of the surface of living cells non-invasively and enables measurement of cellular activities under more physiological conditions than is possible with other high-resolution microscopy techniques. We report here the novel use of the SICM for studying SCs to assess and monitor the status of SCs and various cell types differentiated from SCs.


Publication metadata

Author(s): Gorelik J, Ali NN, Kadir SHSA, Lab M, Stojkovic P, Armstrong L, Sviderskaya EV, Negulyaev YA, Klenerman D, Bennett DC, Lako M, Harding SE, Stojkovic M, Korchev YE

Publication type: Article

Publication status: Published

Journal: Tissue Engineering Part C: Methods

Year: 2008

Volume: 14

Issue: 4

Pages: 311-318

ISSN (print): 1937-3384

ISSN (electronic): 1937-3392

Publisher: Mary Ann Liebert, Inc.

URL: http://dx.doi.org/10.1089/ten.tec.2008.0058

DOI: 10.1089/ten.tec.2008.0058


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