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An Analysis of SEU Robustness of C-Element Structures Implemented in Bulk CMOS and SOI Technologies

Lookup NU author(s): Dr Gordon Russell, Professor Alex Yakovlev


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Publication metadata

Author(s): Al-Tarawneh Z, Russell G, Yakovlev A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 22nd International Conference on Microelectronics (ICM)

Year of Conference: 2010

Pages: 280-283

Publisher: IEEE


DOI: 10.1109/ICM.2010.5696138

Library holdings: Search Newcastle University Library for this item

ISBN: 9781612841496