Publications by Dr Gordon Russell - ePrints

Browsing publications by Dr Gordon Russell.

Newcastle Authors	Title	Year
Nor Mahyuddin Dr Gordon Russell	Single-Event-Upset Sensitivity Analysis on Low-Swing Drivers	2014
Chenxi Ni Ziyad Al Tarawneh Dr Gordon Russell Dr Alex Bystrov	Modelling and analysis of manufacturing variability effects from process to architectural level	2012
Ahmed Alahmadi Dr Gordon Russell Professor Alex Yakovlev	Reconfigurable Time Interval Measurement Circuit Incorporating a Programmable Gain Time Difference Amplifier	2012
Chenxi Ni Dr Gordon Russell Dr Alex Bystrov	Statistical Delay Modelling of Manufacturing Process Variations at System Level	2012
Dr Gordon Russell Dr Frank Burns Professor Alex Yakovlev	VARMA-VARiability Modelling and Analysis Tool	2012
Nor Mahyuddin Dr Gordon Russell Dr Graeme Chester	Design and analysis of a low-swing driver scheme for long interconnects	2011
Santosh Shedabale Dr Gordon Russell Professor Alex Yakovlev	M-PRES: a statistical tool for modelling the impact of manufacturing process variations on circuit-level performance parameters	2011
Jun Zhou Professor David Kinniment Dr Gordon Russell Professor Alex Yakovlev	Sub-threshold Synchronizer	2011
Dr Gordon Russell Professor Alex Yakovlev	An Analysis of SEU Robustness of C-Element Structures Implemented in Bulk CMOS and SOI Technologies	2010
Jun Zhou Professor David Kinniment Dr Gordon Russell	Extending Synchronization from Super-threshold to Sub-threshold Region	2010
Jun Zhou Professor David Kinniment Dr Gordon Russell Professor Alex Yakovlev	Adapting synchronizers to the effects of on chip variability	2008
Santosh Shedabale Dr Gordon Russell Professor Alex Yakovlev	Analysing the Effect of Process Variation to Reduce Parametric Yield Loss	2008
Nikolaos Minas Matthew Marshall Dr Gordon Russell Professor Alex Yakovlev	FPGA implementation of an asynchronous processor with both online and offline testing capabilities	2008
Nikolaos Minas Professor David Kinniment Dr Gordon Russell Professor Alex Yakovlev	High Resolution Flash Time-to-Digital Converter with Sub-Picosecond Measurement Capabilities	2008
Professor David Kinniment Dr Albert Koelmans Dr Alex Bystrov Dr Graeme Chester Dr Gordon Russell et al.	Message from General Chairs	2008
Jun Zhou Professor David Kinniment Dr Gordon Russell Professor Alex Yakovlev	On-chip measurement of deep metastability in synchronizers	2008
Santosh Shedabale Dr Gordon Russell Professor Alex Yakovlev	Stacked strained silicon transistors for low-power high-performance circuit applications	2008
Santosh Shedabale Dr Gordon Russell Professor Alex Yakovlev Dr Sanatan Chattopadhyay	Statistical modelling of the variation in advanced process technologies using a multi-level partitioned response surface approach	2008
Dr Basel Halak Santosh Shedabale Professor Alex Yakovlev Dr Gordon Russell	The impact of variability on the reliability of long on-chip interconnect in the presence of crosstalk	2008
Nikolaos Minas Professor David Kinniment Keith Heron Dr Gordon Russell	A high resolution flash time-to-digital converter taking into account process variability	2007
Nikolaos Minas Professor David Kinniment Keith Heron Dr Gordon Russell	A High Resolution Flash Time-to-Digital Converter Taking Into Account Process Variability	2007
Matthew Marshall Dr Gordon Russell	A low power information redundant concurrent error detecting asynchronous processor	2007
Mohd Abas Dr Gordon Russell Professor David Kinniment	Built-in time measurement circuits – a comparative design study	2007
Mohd Abas Dr Gordon Russell Professor David Kinniment	Embedded high-resolution delay measurement system using time amplification	2007
Professor David Kinniment Keith Heron Dr Gordon Russell Professor Alex Yakovlev	Measuring deep metastability and its effect on synchronizer performance	2007
Jun Zhou Professor David Kinniment Dr Gordon Russell Professor Alex Yakovlev	A robust synchronizer	2006
Professor David Kinniment Keith Heron Dr Gordon Russell	Measuring deep metastability	2006
Henning Bahr Dr Gordon Russell Dr Yajian Li	Extending boundary-scan to perform a memory built-in self-test	2005
Dr Gordon Russell Yong Li Henning Bahr	Low Cost HighTemperature Test System for SoI Devices	2005
Peter Hyde Dr Gordon Russell	A comparative study of the design of synchronous and asynchronous self-checking RISC processors	2004
Peter Hyde Dr Gordon Russell	ASSEC: An asynchronous self-checking RISC-based processor	2004
Dr Gordon Russell	Check bit prediction using Dong's code for logic functions	2004
Mohd Abas Dr Gordon Russell Professor David Kinniment	Design of sub-10-picoseconds on-chip time measurement circuit	2004
Dr Gordon Russell	Improved Brent & Kung adder	2004
Professor David Kinniment Dr Oleg Maevsky Dr Alex Bystrov Dr Gordon Russell Professor Alex Yakovlev et al.	On-chip structures for timing measurement and test	2003
Dr Gordon Russell	E-BIST: Enhanced test-per-clock BIST architecture	2002
Professor David Kinniment Dr Oleg Maevsky Dr Alex Bystrov Dr Gordon Russell Professor Alex Yakovlev et al.	On-chip structures for timing measurement and test	2002
Mohd Abas Dr Alex Bystrov Professor David Kinniment Dr Oleg Maevsky Dr Gordon Russell et al.	Time difference amplifier	2002
Professor David Kinniment Dr Oleg Maevsky Dr Alex Bystrov Dr Gordon Russell Professor Alex Yakovlev et al.	On-Chip structures for Timing Measurement and Test	2001
Dr Gordon Russell	ADOLT - An ADaptable On-Line Testing scheme for VLSI circuits	1999