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Browsing publications by Dr Gordon Russell

Newcastle AuthorsTitleYearFull text
Nor Mahyuddin
Dr Gordon Russell
Single-Event-Upset Sensitivity Analysis on Low-Swing Drivers2014
Chenxi Ni
Ziyad Al Tarawneh
Dr Gordon Russell
Dr Alex Bystrov
Modelling and analysis of manufacturing variability effects from process to architectural level2012
Ahmed Alahmadi
Dr Gordon Russell
Professor Alex Yakovlev
Reconfigurable Time Interval Measurement Circuit Incorporating a Programmable Gain Time Difference Amplifier2012
Chenxi Ni
Dr Gordon Russell
Dr Alex Bystrov
Statistical Delay Modelling of Manufacturing Process Variations at System Level2012
Dr Gordon Russell
Dr Frank Burns
Professor Alex Yakovlev
VARMA-VARiability Modelling and Analysis Tool2012
Nor Mahyuddin
Dr Gordon Russell
Dr Graeme Chester
Design and analysis of a low-swing driver scheme for long interconnects2011
Santosh Shedabale
Dr Gordon Russell
Professor Alex Yakovlev
M-PRES: a statistical tool for modelling the impact of manufacturing process variations on circuit-level performance parameters2011
Jun Zhou
Professor David Kinniment
Dr Gordon Russell
Professor Alex Yakovlev
Sub-threshold Synchronizer2011
Dr Gordon Russell
Professor Alex Yakovlev
An Analysis of SEU Robustness of C-Element Structures Implemented in Bulk CMOS and SOI Technologies2010
Jun Zhou
Professor David Kinniment
Dr Gordon Russell
Extending Synchronization from Super-threshold to Sub-threshold Region2010
Jun Zhou
Professor David Kinniment
Dr Gordon Russell
Professor Alex Yakovlev
Adapting synchronizers to the effects of on chip variability2008
Santosh Shedabale
Dr Gordon Russell
Professor Alex Yakovlev
Analysing the Effect of Process Variation to Reduce Parametric Yield Loss2008
Nikolaos Minas
Matthew Marshall
Dr Gordon Russell
Professor Alex Yakovlev
FPGA implementation of an asynchronous processor with both online and offline testing capabilities2008
Nikolaos Minas
Professor David Kinniment
Dr Gordon Russell
Professor Alex Yakovlev
High Resolution Flash Time-to-Digital Converter with Sub-Picosecond Measurement Capabilities2008
Professor David Kinniment
Dr Albert Koelmans
Dr Alex Bystrov
Dr Graeme Chester
Dr Gordon Russell
et al.		Message from General Chairs2008
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