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Lookup NU author(s): Dr Gabriela Dilliway, Professor Nick Cowern
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The time evolution of self-assembled Ge islands, during low-pressure chemical vapor deposition (LPCVD) of Ge on Si at 650 °C using high growth rates, has been investigated by atomic force microscopy, transmission electron microscopy, and Rutherford backscattering spectrometry. We have found three different island structures. The smallest islands are ldquolens-shapedrdquo and characterized by a rather narrow size distribution, ap4 nm high and ap20 nm wide. Next to form are a distinct population of larger multifaceted ldquodome-shapedrdquo islands, up to 25 nm high and 80–150 nm wide. Finally, the largest islands that form are square-based truncated pyramids with a very narrow size distribution, ap50 nm high and ap250 nm wide. The pyramidal islands normally seen in the intermediate size range (ap150 nm) are not observed. The small lens-shaped islands appear to be defect free, while some of the multifaceted islands as well as all the large truncated pyramids contain misfit dislocations. The existence of multifaceted islands, in the size range where pyramids have previously been reported and of truncated pyramids in the size range where multifaceted ldquodome-shapedrdquo islands have previously been reported, is attributed to the high growth rate used. Furthermore, under the growth conditions used, the truncated-pyramid-shaped islands are characterized by a very narrow size distribution.
Author(s): Cowern NEB; Dilliway GDM; Bagnall DM; Jeynes C
Publication type: Article
Publication status: Published
Journal: Journal of Materials Science: Materials in Electronics
Year: 2003
Volume: 14
Issue: 5-7
Pages: 323-327
ISSN (print): 0957-4522
ISSN (electronic): 1573-482X
Publisher: Springer
URL: http://dx.doi.org/10.1023/A:1023975928759
DOI: 10.1023/A:1023975928759
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