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RF Extraction of Self-Heating Effects in FinFETs

Lookup NU author(s): Sergej Makovejev, Dr Sarah Olsen, Professor Jean-Pierre Raskin

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Author(s): Makovejev S, Olsen SH, Raskin J-P

Publication type: Article

Publication status: Published

Journal: IEEE Transactions on Electron Devices

Year: 2011

Volume: 58

Issue: 10

Pages: 3335-3341

Print publication date: 08/08/2011

ISSN (print): 0018-9383

ISSN (electronic): 1557-9646

Publisher: IEEE

URL: http://dx.doi.org/10.1109/TED.2011.2162333

DOI: 10.1109/TED.2011.2162333

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