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Effect of annealing on interface state density of Ni-silicided Si1-xGex Schottky diodes

Lookup NU author(s): Arup Saha, Dr Sanatan Chattopadhyay

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Publication metadata

Author(s): Saha AR, Chattopadhyay S, Maiti CK

Publication type: Article

Publication status: Published

Journal: Materials Science in Semiconductor Processing

Year: 2004

Volume: 8

Issue: 1-3

Pages: 249-253

ISSN (print): 1369-8001

ISSN (electronic): 1873-4081

Publisher: Pergamon

URL: http://dx.doi.org/10.1016/j.mssp.2004.09.042

DOI: 10.1016/j.mssp.2004.09.042

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