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Lookup NU author(s): Dr Anders Barlow, Dr Naoko Sano, Professor Peter Cumpson
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The clear identification of allotropes and similar chemical states of carbon in XPS imaging can be made difficult because of the subtle differences observed in spectra, particularly when varying from sp(2) to sp(3) hybridised carbon. By shifting focus from the commonly analysed C1s region in XPS spectra to the often ignored C KVV region, we utilise the so-called D-Parameter to identify different forms of carbon in a surface. When this methodology is applied to XPS imaging, the result is a powerful and unambiguous tool for the chemical state identification of carbon in XPS images. Further enhancement by multivariate statistics improves XPS spectral and image quality, and we call this technique Multivariate Auger Feature Imaging. Herein, we have applied this technique to clearly identify in XPS imaging a graphite film mounted on carbon tape. Copyright (c) 2015 John Wiley & Sons, Ltd.
Author(s): Barlow AJ, Scott O, Sano N, Cumpson PJ
Publication type: Article
Publication status: Published
Journal: Surface and Interface Analysis
Year: 2015
Volume: 47
Issue: 2
Pages: 173-175
Print publication date: 01/02/2015
Online publication date: 20/01/2015
Acceptance date: 26/11/2014
ISSN (print): 0142-2421
ISSN (electronic): 1096-9918
Publisher: John Wiley & Sons, Ltd.
URL: http://dx.doi.org/10.1002/sia.5738
DOI: 10.1002/sia.5738
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