Publications by Professor Peter Cumpson - ePrints

Browsing publications by Professor Peter Cumpson.

Newcastle Authors	Title	Year
Professor Peter Cumpson	Argon cluster-ion sputter yield: Molecular dynamics simulations on silicon and equation for estimating total sputter yield	2022
Hang Xiang Dr Shahid Rasul Dr Jose Portoles Professor Peter Cumpson Professor Eileen Yu et al.	Copper–Indium Binary Catalyst on a Gas Diffusion Electrode for High-Performance CO2 Electrochemical Reduction with Record CO Production Efficiency	2020
Dr Sabrina Tardio Professor Peter Cumpson Professor Grant Burgess	Antimicrobial properties of Cu-based bulk metallic glass composites after surface modification	2019
Dr Sadia Sheraz Professor John Vickerman Professor Peter Cumpson	Enhanced Ion Yields Using High Energy Water Cluster Beams for Secondary Ion Mass Spectrometry Analysis and Imaging	2019
Hang Xiang Dr Shahid Rasul Emeritus Professor Keith Scott Dr Jose Portoles Professor Peter Cumpson et al.	Enhanced selectivity of carbonaceous products from electrochemical reduction of CO₂ in aqueous media	2019
Dr Anders Barlow Dr Naoko Sano Dr Billy Murdoch Dr Jose Portoles Professor Peter Cumpson et al.	Observing the evolution of regular nanostructured indium phosphide after gas cluster ion beam etching	2018
Dr Sabrina Tardio Professor Peter Cumpson	Practical estimation of XPS binding energies using widely available quantum chemistry software	2018
Dr Anders Barlow Michael Foster Dr Mariela Bravo Sanchez Dr Jose Portoles Dr Naoko Sano et al.	In situ ion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis	2017
Dr Graham Purvis Emeritus Professor Neil Gray Dr Naoko Sano Dr Anders Barlow Dr Geoffrey Abbott et al.	Decontamination of geological samples by gas cluster ion beam etching or ultra violet/ozone	2017
Dr Dragos Neagu Dr Evangelos Papaioannou Dr Billy Murdoch Dr Anders Barlow Professor Peter Cumpson et al.	Demonstration of chemistry at a point through restructuring and catalytic activation at anchored nanoparticles	2017
Professor Peter Cumpson Dr Naoko Sano	Stability of Reference Masses VIII: X-ray Fluorescence (XRF) as a Noncontact, Nondestructive Measurement Method for Trace Mercury Contamination of Platinum-Group Metal Surfaces	2017
Dr Billy Murdoch Professor Ian Fletcher Professor Peter Cumpson	The plasmonic properties of argon cluster-bombarded InP surfaces	2017
Srinivas Ganti Dr Peter King Dr Erhan Arac Dr Billy Murdoch Professor Peter Cumpson et al.	Voltage Controlled Hot Carrier Injection Enables Ohmic Contacts Using Au Island Metal Films on Ge	2017
Dr Mariela Bravo Sanchez Dr Naoko Sano Professor Peter Cumpson	Water as a catalytic switch in the oxidation of aryl alcohols by polymer incarcerated rhodium nanoparticles	2017
Dr Anders Barlow Sinziana Popescu Dr Naoko Sano Dr John Hedley Professor Peter Cumpson et al.	Chemically specific identification of carbon in XPS imaging using Multivariate Auger Feature Imaging (MAFI)	2016
James Hood Professor Peter Cumpson	Design and Manufacture of a High Resolution Orbital-Trapping Mass-Analyser for Secondary Ion Mass Spectrometry	2016
Dr Naoko Sano Dr Graham Purvis Dr Anders Barlow Dr Geoffrey Abbott Emeritus Professor Neil Gray et al.	Gas cluster ion beam for the characterization of organic materials in submarine basalts as Mars analogs	2016
Professor Peter Cumpson Professor Ian Fletcher Richie Burnett Dr Naoko Sano Dr Anders Barlow et al.	Multispectral Optical Imaging Combined in situ with XPS or ToFSIMS and Principal Component Analysis	2016
Dr Naoko Sano Dr Anders Barlow Professor Peter Cumpson	Optimal conditions for gas cluster ion beams in studying inorganic interface species: improved chemical information at a ZnO interface	2016
Professor Peter Cumpson Professor Ian Fletcher Dr Naoko Sano Dr Anders Barlow	Rapid Multivariate Analysis of 3D ToF-SIMS Data: Graphical Processor Units (GPUs) and Low Discrepancy Subsampling for Large-Scale Principal Component Analysis	2016
Dr Anders Barlow Dr Jose Portoles Dr Naoko Sano Professor Peter Cumpson	Removing Beam Current Artefacts in Helium Ion Microscopy: A Comparison of Image Processing Techniques	2016
Dr Naoko Sano Professor Peter Cumpson	Surface analysis characterisation of gum binders used in modern watercolour paints	2016
Dr Billy Murdoch Dr Jose Portoles Dr Sabrina Tardio Dr Anders Barlow Professor Ian Fletcher et al.	Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection	2016
Professor Peter Cumpson Dr Naoko Sano Professor Ian Fletcher Dr Jose Portoles Dr Mariela Bravo Sanchez et al.	Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method	2015
Dr Anders Barlow Dr Naoko Sano Professor Peter Cumpson	Multivariate Auger Feature Imaging (MAFI) - a new approach towards chemical state identification of novel carbons in XPS imaging	2015
Professor Peter Cumpson	A three-dimensional Mn3O4 network supported on a nitrogenated graphene electrocatalyst for efficient oxygen reduction reaction in alkaline media	2014
Dr Peter King Dr Erhan Arac Srinivas Ganti Sami Ramadan Dr Kelvin Kwa et al.	Fermi Level De-pinning In Metal-Semiconductor Contacts Via Nanometre-scale ALD Dielectric Films	2014
Dr Naoko Sano Professor Peter Cumpson	Multivariate analysis studies of the ageing effect for artist's oil paints containing modern organic pigments	2014
Dr Anders Barlow Dr Jose Portoles Professor Peter Cumpson	Observed damage during Argon gas cluster depth profiles of compound semiconductors	2014
Professor Peter Cumpson	Oxygen reduction reaction by electrochemically reduced graphene oxide	2014
Professor Peter Cumpson	Recent Developments in the Study of the Surface-Stability of Platinum and Platinum-Iridium Mass Standards	2014
Dr Jose Portoles Professor Peter Cumpson	A compact torsional reference device for easy, accurate and traceable AFM piconewton calibration	2013
Professor Peter Cumpson Dr Jose Portoles Dr Anders Barlow Dr Naoko Sano	Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry	2013
Professor Peter Cumpson Dr Jose Portoles Dr Anders Barlow Dr Naoko Sano Dr Mark Birch et al.	Depth profiling organic/inorganic interfaces by argon gas cluster ion beams: sputter yield data for biomaterials, in-vitro diagnostic and implant applications	2013
Dr Enrique Escobedo-Cousin Dr Konstantin Vasilevskiy Dr Toby Hopf Professor Nick Wright Professor Anthony O'Neill et al.	Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon	2013
Professor Peter Cumpson Dr Jose Portoles Dr Naoko Sano	Material dependence of argon cluster ion sputter yield in polymers: Method and measurements of relative sputter yields for 19 polymers	2013
Professor Peter Cumpson Dr Jose Portoles Dr Naoko Sano	Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers	2013
Dr Enrique Escobedo-Cousin Dr Toby Hopf Professor Anthony O'Neill Dr Alton Horsfall Professor Jon Goss et al.	Optimising the Growth of Few-Layer Graphene on Silicone Carbide by Nickel Silicidation	2013
Professor Peter Cumpson Dr Naoko Sano	Stability of reference masses V: UV/ozone treatment of gold and platinum surfaces	2013
Professor Peter Cumpson Dr Naoko Sano Dr Anders Barlow Dr Jose Portoles	Stability of Reference Masses VII. Cleaning methods in air and vacuum applied to a platinum mass standard similar to the international and national kilogram prototypes	2013
Professor Peter Cumpson Dr Jose Portoles Dr Naoko Sano Dr Anders Barlow	Stability of reference masses: VI. Mercury and carbonaceous contamination on platinum weights manufactured at a similar time as the international and national prototype kilograms	2013
Professor Peter Cumpson Dr Jose Portoles Dr Naoko Sano Dr Anders Barlow	X-ray enhanced sputter rates in argon cluster ion sputter-depth profiling of polymers	2013
Professor Peter Cumpson	Effective platform for the generation of aerosol droplets and application in evaluating the effectiveness of a MEMS-based nanoparticle trapping device	2009
Professor Peter Cumpson Dr John Wolstenholme	Report on the 47th IUVSTAworkshop 'angle-resolved XPS: The current status and future prospects for angle-resolved XPS of nano and subnano films'	2009
Professor Peter Cumpson	A multidisciplinary approach to the identification of reference materials for engineered nanoparticle toxicology	2008
Professor Peter Cumpson Dr Jose Portoles	Cantilever Spring-Constant Calibration in Atomic Force Microscopy	2008
Professor Peter Cumpson	Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support	2008
Professor Peter Cumpson	Directly writing with nanoparticles at the nanoscale using dip-pen nanolithography	2007
Dr Jingzhuo Wang Professor Peter Cumpson	Modelling of angle-resolved X-ray photoelectron spectroscopy (ARXPS) intensity ratios for nanocharacterisation of closely packed shell-core nanofibres	2007
Professor Peter Cumpson	The detection of airborne carbon nanotubes in relation to toxicology and workplace safety	2007
Dr Jose Portoles Professor Peter Cumpson Dr John Hedley	Accurate velocity measurements of AFM-cantilever vibrations by Doppler interferometry	2006
Professor Peter Cumpson	Metrology at the nano scale	2005
Professor Peter Cumpson Dr John Hedley	Microelectromechanical device for lateral force calibration in the atomic force microscope: Lateral electrical nanobalance	2005
Professor Peter Cumpson Dr John Hedley	A microfabricated spring-constant calibration device for atomic force microscopy (AFM) potentially traceable to the SI	2004
Dr John Hedley Emeritus Professor James Burdess Dr Alun Harris Dr Barry Gallacher Emeritus Professor Calum McNeil et al.	An optical workstation for characterization and modification of MEMS	2004
Professor Peter Cumpson Dr John Hedley	Calibration of AFM cantilever stiffness: A microfabricated array of reflective springs	2004
Professor Peter Cumpson Dr John Hedley	Microelectromechanical system device for calibration of atomic force microscope cantilever spring constants, between 0.01 and 4 N/m	2004
Professor Peter Cumpson Dr John Hedley	Quantitative analytical atomic force microscopy: A cantilever reference device for easy and accurate AFM spring-constant calibration	2004
Professor Peter Cumpson Dr John Hedley	Accurate analytical measurements in the atomic force microscope: A microfabricated spring constant standard potentially traceable to the SI	2003
Professor Peter Cumpson Dr John Hedley	Accurate force measurement in the atomic force microscope: A microfabricated array of reference springs for easy cantilever calibration	2003
Professor Peter Cumpson	Estimation of inelastic mean free paths for polymers and other organic materials - use of quantitative structure-property relationships	2001
Professor Peter Cumpson	The Thickogram: a method for easy film-thickness measurement in XPS	2000