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Combined X-ray diffraction and fluorescence analysis in the cultural heritage field

Lookup NU author(s): Dr Francesco CarrerORCiD


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X-ray diffraction (XRD) and X-ray fluorescence (XRF) techniques are broadly used for materials characterisation. In some respects, they can be regarded as complementary, as long as the first is mostly used to get phase (crystallographic) information and the second to evaluate chemical composition of the analysed samples. In this paper we present a combined approach for the acquisition and integrated analysis of XRD and XRF data. A novel laboratory instrument has been developed to perform XRD and XRF measurements simultaneously, using the same radiation source and two detectors collecting the diffraction and fluorescence patterns in a scanning mode. A combined Rietveld based refinement of both XRD and XRF data is then performed to obtain phase and chemical compositions. As a field test of the proposed approach, we analysed some archaeological finds from an alpine pastoral enclosure in Val Pore (Val di Sole, Trentino, Italy). The different features of the analysed archaeological specimens provide indications on the wide applicability range of the proposed approach, that may therefore result particularly useful and effective in materials analysis, including those pertaining to the archaeological and cultural heritage fields. (C) 2016 Elsevier B.V. All rights reserved.

Publication metadata

Author(s): Lutterotti L, Dell'Amore F, Angelucci DE, Carrer F, Gialanella S

Publication type: Article

Publication status: Published

Journal: Microchemical Journal

Year: 2016

Volume: 126

Pages: 423-430

Print publication date: 01/05/2016

Online publication date: 28/12/2015

Acceptance date: 20/12/2015

ISSN (print): 0026-265X

ISSN (electronic): 1095-9149

Publisher: Elsevier Inc.


DOI: 10.1016/j.microc.2015.12.031


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