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Lookup NU author(s): Dr Francesco CarrerORCiD
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X-ray diffraction (XRD) and X-ray fluorescence (XRF) techniques are broadly used for materials characterisation. In some respects, they can be regarded as complementary, as long as the first is mostly used to get phase (crystallographic) information and the second to evaluate chemical composition of the analysed samples. In this paper we present a combined approach for the acquisition and integrated analysis of XRD and XRF data. A novel laboratory instrument has been developed to perform XRD and XRF measurements simultaneously, using the same radiation source and two detectors collecting the diffraction and fluorescence patterns in a scanning mode. A combined Rietveld based refinement of both XRD and XRF data is then performed to obtain phase and chemical compositions. As a field test of the proposed approach, we analysed some archaeological finds from an alpine pastoral enclosure in Val Pore (Val di Sole, Trentino, Italy). The different features of the analysed archaeological specimens provide indications on the wide applicability range of the proposed approach, that may therefore result particularly useful and effective in materials analysis, including those pertaining to the archaeological and cultural heritage fields. (C) 2016 Elsevier B.V. All rights reserved.
Author(s): Lutterotti L, Dell'Amore F, Angelucci DE, Carrer F, Gialanella S
Publication type: Article
Publication status: Published
Journal: Microchemical Journal
Year: 2016
Volume: 126
Pages: 423-430
Print publication date: 01/05/2016
Online publication date: 28/12/2015
Acceptance date: 20/12/2015
ISSN (print): 0026-265X
ISSN (electronic): 1095-9149
Publisher: Elsevier Inc.
URL: http://dx.doi.org/10.1016/j.microc.2015.12.031
DOI: 10.1016/j.microc.2015.12.031
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