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Lookup NU author(s): Mohd Abas,
Dr Gordon Russell,
Professor David Kinniment
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The rapid pace of change in IC technology, specifically in speed of operation, demands sophisticated design solutions for IC testing methodologies. Moreover, the current technology of system-on-chip (SOC) makes great demands for testing internal speed accurately as the limitation on accessing internal nodes using I/O pins becomes more difficult. This paper presents two high-resolution time measurement schemes for digital BIST applications, namely: two-delay interpolation method (TDIM) and time amplifier. The two schemes are combined to produce a completely new design for BIST time measurement which offers two main advantages: a low range of timing measurement which has never been achieved before, and a small size of layout occupying 0.2 mm/sup 2/ or equivalent to 3020 transistors. These two features are undoubtedly compatible with present high-speed SOC design architectures. (5 References).
Author(s): Abas MA, Russell G, Kinniment DJ
Publication type: Conference Proceedings (inc. Abstract)
Publication status: Published
Conference Name: Design, Automation and Test in Europe Conference and Exhibition. IEEE Comput. Soc. Part Vol.2, 2004
Year of Conference: 2004
Pages: 804-9 Vol
Publisher: IEEE Computer Society
Notes: Gielen G
2. Los Alamitos, CA, USA.
Proceedings. Design, Automation and Test in Europe Conference and Exhibition. Paris, France. EDAA, EDA Consortium, IEEE Comput. Soc. TTTC. IEEE Comput. Soc. DATC. ECSI. ACM/SIGDA. RAS. 16-20 Feb. 2004.
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