Toggle Main Menu Toggle Search

Open Access padlockePrints

The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

A microfabricated spring-constant calibration device for atomic force microscopy (AFM) potentially traceable to the SI

Lookup NU author(s): Professor Peter Cumpson, Dr John HedleyORCiD

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Abstract

We have developed a compact and easy-to-use MEMS (micro electro-mechanical) calibration device for Atomic Force Microscopy, using a method that allows traceability to the SI system. The new device, which we call an Electrical Nanobalance, is calibrated by a non-contact method, a combination of electrical measurements and Doppler velocimetry. For the AFM user, the device offers a simple, accurate and traceable method for AFM cantilever spring constant calibration, for the first time. © 2004 British Crown Copyright.

Publication metadata

Author(s): Cumpson PJ, Hedley J

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Conference on Precision Electromagnetic Measurements Digest

Year of Conference: 2004

Pages: 269-270

Publisher: IEEE

URL: http://dx.doi.org/10.1109/CPEM.2004.305567

DOI: 10.1109/CPEM.2004.305567

Library holdings: Search Newcastle University Library for this item

ISBN: 0780384938

Share