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On the relationship between electrical performance and Raman spectroscopic results for strained Si/SiGe

Lookup NU author(s): Professor Steve BullORCiD

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Publication metadata

Author(s): Bull SJ, et al

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Fourth International Conference on Silicon Epitaxy and Heterostructures (ICSi4)

Year of Conference: 2005

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