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Fundamental diffusion issues for deep submicron device scaling

Lookup NU author(s): Professor Nick Cowern

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Publication metadata

Author(s): Cowern NEB; Jaraiz M; Cristiano F; Claverie A; Mannino G

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: International Electron Device Meeting

Year of Conference: 1999

Pages: 333-335

Publisher: IEEE

URL: http://dx.doi.org/10.1109/IEDM.1999.824163

DOI: 10.1109/IEDM.1999.824163

Notes: Invited paper

Library holdings: Search Newcastle University Library for this item

ISBN: 0780354109

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