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The Newcastle University research output collection, currently available on ePrints, will shortly be moving to a new open repository platform, Figshare. To prepare for the data migration we have paused adding new content to ePrints, and will resume once the new repository is launched. During this time you will continue to have access to ePrints (but no new content will appear). We will share updates here when available.

A study of SiGe/Si n-MOSFET processed and unprocessed channel layers using FIB and TEM methods

Lookup NU author(s): Dr Sarah OlsenORCiD, Professor Anthony O'Neill

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Publication metadata

Author(s): Chang ACK, Norris DJ, Ross IM, Cullis AG, Olsen SH, O'Neill AG

Editor(s): Cullis, A.G., Hutchison, J.L.

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Proceedings of the 14th Conference on Microscopy of Semiconducting Materials (MSM)

Year of Conference: 2005

Pages: 111-114

Publisher: Springer

URL: http://dx.doi.org/10.1007/3-540-31915-8_23

DOI: 10.1007/3-540-31915-8_23

Library holdings: Search Newcastle University Library for this item

Series Title: Springer Proceedings in Physics

ISBN: 9783540319146


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