Publications by Professor Anthony O'Neill - ePrints

Browsing publications by Professor Anthony O'Neill.

Newcastle Authors	Title	Year
Dr Boubker Zaaimi Mark Turnbull Dr Anupam Hazra Dr Yujiang Wang Dr Carolina Gandara De Souza et al.	Closed-loop optogenetic control of normal and pathological network dynamics	2023
Dr Boubker Zaaimi Mark Turnbull Dr Anupam Hazra Dr Yujiang Wang Dr Carolina Gandara de Souza et al.	Closed-loop optogenetic control of the dynamics of neural activity in non-human primates	2023
Dr Enrique Escobedo-Cousin Dr Johan Gausden Professor Anthony O'Neill	Voiding in Parylene-C Encapsulation of Surface Mount LEDs for an Optogenetic Epilepsy Neuroprosthesis	2023
Dr Stuart Maitland Dr Enrique Escobedo-Cousin Dr Ian Schofield Professor Anthony O'Neill Professor Stuart Baker et al.	Electrical cross-sectional imaging of human motor units in vivo	2022
Dimitrios Firfilionis Frances Hutchings Dr Reza Tamadoni Jahromi Dr Darren Walsh Mark Turnbull et al.	A Closed-Loop Optogenetic Platform	2021
Dr Guangru Zhang Dr Dragos Neagu Dr Peter King Professor Anthony O'Neill Professor Ian Metcalfe et al.	The effects of sulphur poisoning on the microstructure, composition andoxygen transport properties of perovskite membranes coated withnanoscale alumina layers	2021
Dr Zi Jie Choong Dr Dehong Huo Dr Nilhil Ponon Rachael Savidis Professor Patrick Degenaar et al.	A novel hybrid technique to fabricate silicon-based micro-implants with near defect-free quality for neuroprosthetics application	2020
Dimitrios Firfilionis Dr Wei Xu Dr Darren Walsh Dr Enrique Escobedo-Cousin Dr Reza Ramezani et al.	The Neural Engine: A Reprogrammable Low Power Platform for Closed-loop Optogenetics	2020
Dr Emma Brunton Dr Enrique Escobedo-Cousin Dr Gaurav Gupta Professor Roger Whittaker Professor Anthony O'Neill et al.	W:Ti flexible transversal electrode array for peripheral nerve stimulation: A feasibility study	2020
Dr Jesus Urresti Ibanez Dr Sarah Olsen Professor Nick Wright Professor Anthony O'Neill	Design and Analysis of High Mobility Enhancement Mode 4H-SiC MOSFETs Using a Thin SiO₂ / Al₂O₃Gate Stack	2019
Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill	Edge chipping minimisation strategy for milling of monocrystalline silicon: A molecular dynamics study	2019
Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill	Micro-machinability and edge chipping mechanism studies on diamond micro-milling of monocrystalline silicon	2019
Professor Anthony O'Neill Faiz Arith Dr Jesus Urresti Ibanez Dr Konstantin Vasilevskiy Professor Nick Wright et al.	High Mobility 4H-SiC MOSFET	2018
Faiz Arith Dr Jesus Urresti Ibanez Dr Konstantin Vasilevskiy Dr Sarah Olsen Professor Nick Wright et al.	High mobility 4H-SiC MOSFET using a thin SiO₂/Al₂O₃ gate stack	2018
Faiz Arith Dr Jesus Urresti Ibanez Dr Konstantin Vasilevskiy Dr Sarah Olsen Professor Nick Wright et al.	Increased Mobility in Enhancement Mode 4H-SiC MOSFET Using a Thin SiO₂ / Al₂O₃ Gate Stack	2018
Dr Sarah Olsen Professor Anthony O'Neill	Measurements of gate-oxide interface roughness in strained-Si virtual substrate SiGe/Si MOSFET device structures	2018
Dr Rolando Berlinguer Palmini Dr Nilhil Ponon Professor Anthony O'Neill Professor Patrick Degenaar	Opto‐electro‐thermal optimization of photonic probes for optogenetic neural stimulation	2018
Dr Fahimeh Dehkhoda Dr Ahmed Abd El-Aal Dr Nilhil Ponon Professor Andrew Jackson Professor Anthony O'Neill et al.	Self-sensing of temperature rises on light emitting diode based optrodes	2018
Sandip Roy Dr Jesus Urresti Ibanez Professor Anthony O'Neill Professor Nick Wright Dr Alton Horsfall et al.	Characterisation of 4H-SiC MOS capacitor with a protective coating for harsh environments applications	2017
Dr Fahimeh Dehkhoda Dr Ahmed Abd El-Aal Dr Nilhil Ponon Professor Anthony O'Neill Professor Patrick Degenaar et al.	LED-Based Temperature Sensor	2017
Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill	Micro-machining of monocrystalline silicon with improved edge quality	2017
Srinivas Ganti Dr Peter King Dr Erhan Arac Dr Billy Murdoch Professor Peter Cumpson et al.	Voltage Controlled Hot Carrier Injection Enables Ohmic Contacts Using Au Island Metal Films on Ge	2017
Harbaljit Sohal Dr Konstantin Vasilevskiy Professor Andrew Jackson Professor Stuart Baker Professor Anthony O'Neill et al.	Design and Microfabrication Considerations for Reliable Flexible Intracortical Implants	2016
Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill	Effect of crystallographic orientation and employment of different cutting tools on micro-end-milling of monocrystalline silicon	2016
Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill	Investigation of edge-chipping reduction on silicon micro-milling	2016
Harbaljit Sohal Dr Gavin Clowry Professor Andrew Jackson Professor Anthony O'Neill Professor Stuart Baker et al.	Mechanical Flexibility Reduces the Foreign Body Response to Long-Term Implanted Microelectrodes in Rabbit Cortex	2016
Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill	Micro-Machinability Studies of Single Crystal Silicon Using Diamond End-Mill	2016
Sami Ramadan Dr Kelvin Kwa Dr Peter King Professor Anthony O'Neill	Reliable Fabrication of Sub-10 nm Silicon Nanowires by Optical Lithography	2016
Professor Anthony O'Neill	(Invited) Negative Capacitance Using Ferroelectrics for Future Steep-Slope MOSFETS	2015
Dr Nilhil Ponon Dan Appleby Dr Erhan Arac Dr Peter King Srinivas Ganti et al.	Effect of deposition conditions and post deposition anneal on reactively sputtered titanium nitride thin films	2015
Dr Enrique Escobedo-Cousin Dr Peter King Professor Anthony O'Neill Dr Alton Horsfall Professor Jon Goss et al.	Electrical Characterization of Epitaxial Graphene Field-Effect Transistors with High-k Al₂O₃ Gate Dielectric Fabricated on SiC Substrates	2015
Dr Toby Hopf Dr Konstantin Vasilevskiy Dr Enrique Escobedo-Cousin Dr Alton Horsfall Professor Jon Goss et al.	Facile technique for the removal of metal contamination from graphene	2015
Dr Toby Hopf Dr Konstantin Vasilevskiy Enrique Escobedo-Cousin Professor Nick Wright Dr Alton Horsfall et al.	Determination of the adhesion energy of graphene on SiC(0001) via measurement of pleat defects	2014
Dr Toby Hopf Dr Konstantin Vasilevskiy Dr Enrique Escobedo-Cousin Dr Peter King Professor Nick Wright et al.	Dirac point and transconductance of top-gated graphene field-effect transistors operating at elevated temperature	2014
Nor Za'bah Dr Kelvin Kwa Professor Anthony O'Neill	Electrical characterisation of highly doped triangular silicon nanowires	2014
Dan Appleby Dr Nilhil Ponon Dr Kelvin Kwa Professor Anthony O'Neill	Experimental Observation of Negative Capacitance in Ferroelectrics at Room Temperature	2014
Dr Peter King Dr Erhan Arac Srinivas Ganti Sami Ramadan Dr Kelvin Kwa et al.	Fermi Level De-pinning In Metal-Semiconductor Contacts Via Nanometre-scale ALD Dielectric Films	2014
Dan Appleby Dr Nilhil Ponon Dr Kelvin Kwa Srinivas Ganti Professor Anthony O'Neill et al.	Ferroelectric properties in thin film barium titanate grown using pulsed laser deposition	2014
Dr Nilhil Ponon Dan Appleby Dr Erhan Arac Dr Kelvin Kwa Professor Jon Goss et al.	Impact of Crystalline Orientation on the Switching Field in Barium Titanate Using Piezoresponse Force Spectroscopy	2014
Dr Peter King Dr Erhan Arac Srinivas Ganti Dr Kelvin Kwa Dr Nilhil Ponon et al.	Improving metal/semiconductor conductivity using AlO_x interlayers on n-type and p-type Si	2014
Dr Toby Hopf Dr Konstantin Vasilevskiy Dr Enrique Escobedo-Cousin Professor Anthony O'Neill Dr Alton Horsfall et al.	Optimizing the vacuum growth of epitaxial graphene on 6H-SiC	2014
Dr Enrique Escobedo-Cousin Dr Toby Hopf Professor Nick Wright Professor Anthony O'Neill Dr Alton Horsfall et al.	Solid phase growth of graphene on silicon carbide by nickel silicidation: graphene formation mechanisms	2014
Dr Enrique Escobedo-Cousin Dr Konstantin Vasilevskiy Dr Toby Hopf Professor Nick Wright Professor Anthony O'Neill et al.	Solid Phase Growth of Graphene on Silicon Carbide by Nickel Silicidation: Graphene Formation Mechanisms	2014
Harbaljit Sohal Professor Andrew Jackson Dr Gavin Clowry Dr Konstantin Vasilevskiy Professor Anthony O'Neill et al.	The sinusoidal probe: a new approach to improve electrode longevity	2014
Professor Anthony O'Neill Dan Appleby Dr Nilhil Ponon Dr Kelvin Kwa	Towards steep slope MOSFETs using ferroelectric negative capacitance	2014
Raied Al-Hamadany Professor Jon Goss Professor Patrick Briddon Professor Anthony O'Neill Dr Mark Rayson et al.	Impact of tensile strain on the oxygen vacancy migration in SrTiO₃: Density functional theory calculations	2013
Dr Enrique Escobedo-Cousin Dr Konstantin Vasilevskiy Dr Toby Hopf Professor Nick Wright Professor Anthony O'Neill et al.	Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon	2013
Dr Enrique Escobedo-Cousin Dr Toby Hopf Professor Anthony O'Neill Dr Alton Horsfall Professor Jon Goss et al.	Optimising the Growth of Few-Layer Graphene on Silicone Carbide by Nickel Silicidation	2013
Raied Al-Hamadany Professor Jon Goss Professor Patrick Briddon Meaad Al-Hadidi Professor Anthony O'Neill et al.	Oxygen vacancy migration in compressively strained SrTiO3	2013
Nor Za'bah Dr Kelvin Kwa Professor Anthony O'Neill	The study on the aspect ratio of Atomic Force Microscope (AFM) measurements for triangular silicon nanowire	2013
Dr Kelvin Kwa Professor Jon Goss Dr Zhiyong Zhou Dr Nilhil Ponon Dan Appleby et al.	A comprehensive study on the leakage current mechanisms of Pt/SrTiO₃/Pt capacitor	2012
Professor Jon Goss Dr Kelvin Kwa Professor Anthony O'Neill	Anomalous resistive switching phenomenon	2012
Dr Nilhil Ponon Dan Appleby Dr Kelvin Kwa Professor Anthony O'Neill	Ferroelectrics for nanoelectronics	2012
Professor Jon Goss Dr Kelvin Kwa Raied Al-Hamadany Dan Appleby Dr Nilhil Ponon et al.	Leakage current asymmetry and resistive switching behavior of SrTiO3	2012
Dr Enrique Escobedo-Cousin Dr Konstantin Vasilevskiy Irina Nikitina Professor Nick Wright Professor Anthony O'Neill et al.	Local Solid Phase Epitaxy of Few-Layer Graphene on Silicon Carbide	2012
Nor Za'bah Dr Kelvin Kwa Professor Anthony O'Neill	Top-down fabrication of single crystal silicon nanowire using optical lithography	2012
Mouhsine Fjer Dr Stefan Persson Dr Enrique Escobedo-Cousin Professor Anthony O'Neill	Low Frequency Noise in Strained Si Heterojunction Bipolar Transistors	2011
Harbaljit Sohal Professor Andrew Jackson Robert Jackson Dr Konstantin Vasilevskiy Dr Gavin Clowry et al.	A novel flexible sinusoidal electrode to enhance longevity of chronic neuronal recordings	2010
Dr Barry Gallacher Professor Steve Bull Dr Alton Horsfall Professor Anthony O'Neill	Analysis and characterization of a mechanical sensor to monitor stress in interconnect features	2010
Rouzet Agaiby Dr Sarah Olsen Professor Anthony O'Neill	Direct measurement of MOSFET channel strain by means of backside etching and Raman spectroscopy on long-channel devices	2010
Layi Alatise Dr Sarah Olsen Professor Anthony O'Neill	Improved self-gain in deep submicrometer strained silicon-germanium pMOSFETs with HfSiOx/TiSiN gate stacks	2010
Dr Alton Horsfall Professor Anthony O'Neill	In situ X-ray diffraction study of self-forming barriers from a Cu-Mn alloy in 100 nm Cu/Iow-k damascene interconnects using synchrotron radiation	2010
Dr Alton Horsfall Professor Anthony O'Neill	In situ X-ray diffraction study of self-forming barriers from a Cu-Mn alloy in 100 nm Cu/low-k damascene interconnects using synchrotron radiation	2010
Dr Basel Halak Professor Alex Yakovlev Professor Anthony O'Neill	Is a single cell sensor possible?	2010
Layi Alatise Dr Sarah Olsen Professor Anthony O'Neill	Linearity and mobility degradation in strained Si MOSFETs with thin gate dielectrics	2010
Dr Stefan Persson Mouhsine Fjer Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Anthony O'Neill et al.	Strained-Silicon Heterojunction Bipolar Transistor	2010
Layi Alatise Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill	The impact of self-heating and SiGe strain-relaxed buffer thickness on the analog performance of strained Si nMOSFETs	2010
Professor Anthony O'Neill	X-ray propagation in multiwall carbon nanotubes	2010
Liang Yan Dr Sarah Olsen Professor Anthony O'Neill	1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack	2009
Layi Alatise Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill	A design methodology for maximizing the voltage gain of strained Si MOSFETs using the thickness of the silicon-germanium strain relaxed buffer as a design parameter	2009
Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill	A NEMS-based sensor to monitor stress in deep sub-micron Cu/Low-k interconnects	2009
Christopher Wilson Professor Anthony O'Neill Dr Alton Horsfall	Application of a Nano-Mechanical Sensor to Monitor Stress in Copper Damascene Interconnects	2009
Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Anthony O'Neill	Defect identification in strained Si/SiGe heterolayers for device applications	2009
Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill	Demonstration of a Sub-micron Damascene Cu/Low-k Mechanical Sensor to Monitor Stress in BEOL Metallization	2009
Layi Alatise Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill	Improved Analog Performance in Strained-Si MOSFETs Using the Thickness of the Silicon-Germanium Strain-Relaxed Buffer as a Design Parameter	2009
Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	Optimization of the channel lateral strain profile for improved performance of multi-gate MOSFETs	2009
Dr Sarah Olsen Professor Nick Cowern Professor Anthony O'Neill	Performance Enhancements in Scaled Strained-SiGe pMOSFETs With HfSiOx/TiSiN Gate Stacks	2009
Irina Nikitina Dr Konstantin Vasilevskiy Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al.	Phase composition and electrical characteristics of nickel silicide Schottky contacts formed on 4H-SiC	2009
Dr Konstantin Vasilevskiy Irina Nikitina Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al.	Silicon Carbide Static Induction Transistor with Implanted Buried Gate	2009
Dr Sarah Olsen Liang Yan Dr Enrique Escobedo-Cousin Professor Anthony O'Neill	Strained Si/SiGe MOS technology: Improving gate dielectric integrity	2009
Dr Alton Horsfall Professor Anthony O'Neill	Study of the effect of dielectric porosity on the stress in advanced Cu/low-k interconnects using x-ray diffraction	2009
Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill	Synchrotron measurement of the effect of dielectric porosity and air gaps on the stress in advanced Cu/low-k interconnects	2009
Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill	Synchrotron measurement of the effect of linewidth scaling on stress in advanced Cu/Low-k interconnects	2009
Dr Barry Gallacher Professor Anthony O'Neill Professor Steve Bull Dr Alton Horsfall	Analysis of a passive sensor for predicting process-induced stress in advanced integrated circuit interconnect	2008
Professor Anthony O'Neill	Analysis of self-heating effects in ultrathin-body SOI MOSFETs by device simulation	2008
Professor David Herbert Professor Anthony O'Neill	Bragg scattering of x-rays in multiwalled carbon nanotubes	2008
Dr Stefan Persson Mouhsine Fjer Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Anthony O'Neill et al.	Fabrication and characterisation of strained Si heterojunction bipolar transistors on virtual substrates	2008
Layi Alatise Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill	Improved Analog Performance of Strained Si n-MOSFETs on Thin SiGe Strained Relaxed Buffers	2008
Liang Yan Dr Sarah Olsen Dr Enrique Escobedo-Cousin Professor Anthony O'Neill	Improved gate oxide integrity of strained Si n-channel metal oxide silicon field effect transistors using thin virtual substrates	2008
Professor Anthony O'Neill Dr Alton Horsfall	Influence of barriers on the reliability of dual damascene copper contacts	2008
Professor Anthony O'Neill Dr Sarah Olsen	Insight into the aggravated lifetime reliability in advanced MOSFETs with strained-Si channels on SiGe strain-relaxed buffers due to self-heating	2008
Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	Investigation of Strain Profile Optimization in gate-all-around suspended silicon nanowire FET	2008
Rouzet Agaiby Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill et al.	Nanometer Scale Strain Profiling Through Si-SiGe Heterolayers	2008
Rouzet Agaiby Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill et al.	Nanometer strain profiling through Si/SiGe quantum layers	2008
Dr Sarah Olsen Dr Piotr Dobrosz Rouzet Agaiby Dr Yuk Tsang Layi Alatise et al.	Nanoscale strain characterisation for ultimate CMOS and beyond	2008
Dr Sarah Olsen Dr Piotr Dobrosz Rouzet Agaiby Dr Yuk Tsang Layi Alatise et al.	Nanoscale strain characterisation for ultimate CMOS and beyond	2008
Dr Piotr Dobrosz Dr Sarah Olsen Professor Steve Bull Dr Yuk Tsang Rouzet Agaiby et al.	Nanoscale strain characterisation in patterned SSOI structures	2008
Irina Nikitina Dr Konstantin Vasilevskiy Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al.	Phase Inhomogeneity and Electrical Characteristics of Nickel Silicide Schottky Contacts Formed on 4H-SiC	2008
Professor Anthony O'Neill Dr Yuk Tsang Dr Barry Gallacher Dr Sarah Olsen	Piezomobility description of strain-induced mobility	2008
Professor Anthony O'Neill Rouzet Agaiby Dr Sarah Olsen Yang Yang	Reduced self-heating by strained silicon substrate engineering	2008
Dr Sarah Olsen John Varzgar Dr Enrique Escobedo-Cousin Rouzet Agaiby Dr Piotr Dobrosz et al.	Strain engineering for high mobility channels	2008
Professor Andrew Houlton Dr Ben Horrocks Professor Nick Wright Dr Sarah Olsen Professor Anthony O'Neill et al.	Top down and Bottom-up Routes to Nanoscale Electronic Components	2008
Dr Yuk Tsang Professor Anthony O'Neill Dr Barry Gallacher Dr Sarah Olsen	Using piezoresistance model with C-R conversion for modeling of strain-induced mobility	2008
Professor Anthony O'Neill Dr Sarah Olsen Yang Yang Rouzet Agaiby	[invited] Engineering Self-Heating by Strained Silicon Technology	2007
Dr Alton Horsfall Professor Anthony O'Neill	Application of CVD-W Diffusion Barrier Layers to Dual Damascene Copper Contacts	2007
Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	Bended gate-all-around nanowire MOSFET: A device with enhanced carrier mobility due to oxidation-induced tensile stress	2007
Dr Alton Horsfall Professor Steve Bull Professor Anthony O'Neill	Comparative study of novel barrier layers in ULSI copper interconnects	2007
Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill Professor Nick Wright Professor Steve Bull et al.	Direct measurement of electromigration-induced stress in interconnect structures	2007
Professor Anthony O'Neill Dr Sarah Olsen Dr Yuk Tsang Dr Piotr Dobrosz	Evolution of strain engineering for Si technology	2007
Dr Konstantin Vasilevskiy Irina Nikitina Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al.	High voltage silicon carbide schottky diodes with single zone junction termination extension	2007
Dr Yuk Tsang Dr Sanatan Chattopadhyay Dr Suresh Uppal Dr Enrique Escobedo-Cousin Deepak Ramakrishnan et al.	Modeling of the threshold voltage in strained Si/Si1-x Gex/S1-yGey(x ≥ y) CMOS architectures	2007
Rouzet Agaiby Yang Yang Dr Sarah Olsen Professor Anthony O'Neill	Quantifying self-heating effects in strained Si MOSFETs with scaling	2007
Rimoon Agaiby Yang Yang Dr Sarah Olsen Professor Anthony O'Neill	Quantifying self-heating effects with scaling in globally strained Si MOSFETs	2007
Professor Anthony O'Neill Dr Sarah Olsen Yang Yang Rouzet Agaiby	Reduced self-heating by strained Si substrate engineering	2007
Professor Anthony O'Neill Dr Sarah Olsen Rimoon Agaiby	Reduced self-heating by strained Si substrate engineering	2007
Professor Anthony O'Neill Dr Sarah Olsen Yang Yang Rouzet Agaiby	Reduced Self-Heating by Strained Silicon Substrate Engineering	2007
Dr Sarah Olsen Rouzet Agaiby Dr Enrique Escobedo-Cousin Professor Anthony O'Neill	Strained Si/SiGe MOS technology: improving gate dielectric integrity	2007
Dr Sarah Olsen Dr Enrique Escobedo-Cousin Professor Anthony O'Neill	Strained Si/SiGe MOS technology: Improving gate dielectric integrity	2007
Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Anthony O'Neill Layi Alatise Rouzet Agaiby et al.	Strained Si/strained SiGe/relaxed SiGe structures: identifying roughness due to compressed SiGe and its impact on high mobility MOSFETs	2007
Dr Enrique Escobedo-Cousin Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill et al.	Thermal stability of supercritical thickness-strained Si layers on thin strain-relaxed buffers	2007
Professor David Herbert Professor Anthony O'Neill	X-ray propagation in carbon nanotubes	2007
Liang Yan Dr Sarah Olsen Dr Mehdi Kanoun Rimoon Agaiby Goutan Dalapati et al.	Analysis of gate leakage characteristics in strained Si MOSFETs	2006
Dr Sarah Olsen Dr Mehdi Kanoun Mohamed Al-Areeki Rimoon Agaiby Goutan Dalapati et al.	Analysis of gate leakage in strained Si MOSFETs	2006
Liang Yan Dr Sarah Olsen Dr Mehdi Kanoun Rimoon Agaiby Goutan Dalapati et al.	Analysis of Gate Leakage in Strained Si MOSFETs	2006
Dr Yuk Tsang Dr Sanatan Chattopadhyay Dr Kelvin Kwa Goutan Dalapati Rouzet Agaiby et al.	Analytical model for threshold voltage of p-MOSFET in strained-Si/SiGe dual channel architecture	2006
Praneet Bhatnagar Dr Alton Horsfall Professor Nick Wright Dr Christopher Johnson Dr Konstantin Vasilevskiy et al.	Analytical modelling of I-V characteristics for 4H-SiC enhancement mode VJFET	2006
Professor Anthony O'Neill	Calibration of 4H-SiC TCAD models and material parameters	2006
Dr Sanatan Chattopadhyay John Varzgar Dr Johan Seger Dr Yuk Tsang Dr Kelvin Kwa et al.	Capacitance-voltage (C-V) technique for the characterisation of stained Si/Si1-xGex hetero-structure MOS devices	2006
Dr Sanatan Chattopadhyay John Varzgar Dr Johan Seger Dr Yuk Tsang Dr Kelvin Kwa et al.	Capacitance-voltage (C-V) technique for the characterisation of strained Si/Si1-xGex hetero-structure MOS devices	2006
Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rimoon Agaiby Dr Johan Seger et al.	Control of self-heating in thin virtual substrate strained Si MOSFETs	2006
Dr Konstantin Vasilevskiy Irina Nikitina Professor Nick Wright Dr Alton Horsfall Professor Anthony O'Neill et al.	Device processing and characterisation of high temperature silicon carbide Schottky diodes	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin Rimoon Agaiby Professor Steve Bull et al.	Device related characterisation techniques for Si/SiGe heterostructures	2006
Professor Anthony O'Neill	Device-related characterisation techniques for Si/SiGe heterosructures	2006
Dr Alton Horsfall Professor Anthony O'Neill Professor Nick Wright Professor Steve Bull	Direct measurement of electromigration induced stress in interconnect structures	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Yuk Tsang Dr Piotr Dobrosz	Evolution of strain engineering for Si technology	2006
Goutan Dalapati Dr Sanatan Chattopadhyay Luke Driscoll Professor Anthony O'Neill Dr Kelvin Kwa et al.	Extraction and modelling of strained-Si MOSFET parameters using small signal channel conductance method	2006
Goutan Dalapati Dr Sanatan Chattopadhyay Luke Driscoll Professor Anthony O'Neill Dr Kelvin Kwa et al.	Extraction of strained-Si metal-oxide-semiconductor field-effect transistor parameters using small signal channel conductance method	2006
Liang Yan Dr Sarah Olsen Dr Mehdi Kanoun Professor Anthony O'Neill	Gate leakage mechanisms in strained Si devices	2006
John Varzgar Dr Mehdi Kanoun Dr Suresh Uppal Dr Sanatan Chattopadhyay Dr Sarah Olsen et al.	Gate Oxide Reliability of Strained Si NMOS Devices Employing a Thin SiFe Strain Relaxed Buffer	2006
John Varzgar Dr Sanatan Chattopadhyay Dr Suresh Uppal Dr Sarah Olsen Professor Anthony O'Neill et al.	Gate oxide reliability of strained Si NMOS devices employing a thin SiGe strain-relaxed buffer	2006
Dr Suresh Uppal John Varzgar Dr Sanatan Chattopadhyay Dr Sarah Olsen Professor Anthony O'Neill et al.	Gate oxide reliability of strained Si/SiGe MOS: effect of Ge content variation	2006
Dr Suresh Uppal John Varzgar Dr Mehdi Kanoun Dr Sanatan Chattopadhyay Dr Sarah Olsen et al.	Gate Oxide Reliability on strained Si/SiGe MOS: Effect of Ge content variation	2006
Dr Suresh Uppal Dr Mehdi Kanoun Dr Sanatan Chattopadhyay Rimoon Agaiby Dr Sarah Olsen et al.	Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices	2006
Dr Suresh Uppal Dr Mehdi Kanoun Dr Sanatan Chattopadhyay Rouzet Agaiby Dr Sarah Olsen et al.	Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices	2006
Dr Konstantin Vasilevskiy Irina Nikitina Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al.	High temperature operation of silicon carbide Schottky diodes with recoverable avalanche breakdown	2006
Dr Suresh Uppal Dr Mehdi Kanoun John Varzgar Dr Sanatan Chattopadhyay Dr Sarah Olsen et al.	Impact of Ge content on the gate oxide reliability of strained-Si/SiGe MOS devices	2006
Dr Suresh Uppal Dr Mehdi Kanoun John Varzgar Dr Sanatan Chattopadhyay Dr Sarah Olsen et al.	Impact of Ge content on the gate oxide reliability of strained-Si/SiGe MOS devices	2006
Goutan Dalapati Dr Kelvin Kwa Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al.	Impact of strained Si thickness and Ge our diffusion on strained-Si/SiO2 interface quality for surface channel strained Si n-MOSFET devices	2006
Goutan Dalapati Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen Dr Yuk Tsang et al.	Impact of strained-Si thickness and Ge out-diffusion on gate oxide quality for strained-Si surface channel n-MOSFETs	2006
Dr Nebojsa Jankovic Professor Professor Anthony O'Neill	Modelling of strained-Si/SiGe NMOS transistors including DC self-heating	2006
Rimoon Agaiby Professor Anthony O'Neill Dr Sarah Olsen	Quantifying Self-Heating Effects in Strained Si MOSFETs with Scaling	2006
Rimoon Agaiby Professor Anthony O'Neill Dr Sarah Olsen	Quantifying self-heating effects in strained Si MOSFETs with scaling	2006
Arup Saha Dr Alton Horsfall Dr Sanatan Chattopadhyay Professor Nick Wright Professor Anthony O'Neill et al.	Quantum-mechanical modeling of current-voltage characteristics of Ti-silicided Schottky diodes	2006
John Varzgar Dr Mehdi Kanoun Dr Suresh Uppal Dr Sanatan Chattopadhyay Dr Yuk Tsang et al.	Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures	2006
John Varzgar Dr Mehdi Kanoun Dr Suresh Uppal Dr Sanatan Chattopadhyay Dr Yuk Tsang et al.	Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures	2006
Dr Sarah Olsen Dr Piotr Dobrosz Dr Enrique Escobedo-Cousin Rouzet Agaiby Rimoon Agaiby et al.	Strain characterisation in advanced Si devices	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rimoon Agaiby et al.	Strained Si MOSFETs using thin virtual substrates	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rimoon Agaiby et al.	Strained Si technology	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Sanatan Chattopadhyay	Strained Si/SiGe MOS technology	2006
Professor Anthony O'Neill	Strained Si: Materials, Devices and Processing	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rouzet Agaiby et al.	Strained silicon technology	2006
Irina Nikitina Dr Konstantin Vasilevskiy Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al.	Structural pattern formation in titanium-nickel contacts on silicon carbide following high-temperature annealing	2006
Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Steve Bull Professor Anthony O'Neill	Structuralstability of strained Si layers on thin strain-relaxed buffers for high performance MOSFETs	2006
Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Steve Bull Professor Anthony O'Neill	Study of surface roughness and dislocation generation in strained Si layers grown on thin strain-relaxed buffers for high performance MOSFETs	2006
Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill	The relationship between strain generation and relaxation, composition and electrical performance in strained Si/SiGe MOS technology	2006
Goutan Dalapati Dr Kelvin Kwa Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al.	Thermal oxidation of strained-Si: impact of strained-Si thickness and Ge on Si/SiO2 interface	2006
Dr Sarah Olsen Professor Steve Bull Dr Piotr Dobrosz Dr Enrique Escobedo-Cousin Rouzet Agaiby et al.	Thermal stability of thin virtual substrates for high performance devices	2006
Dr Sarah Olsen Professor Anthony O'Neill	A study of SiGe/Si n-MOSFET processed and unprocessed channel layers using FIB and TEM methods	2005
Professor Anthony O'Neill Dr Sarah Olsen	Advancing strained silicon	2005
Professor Steve Bull Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	Assessment of strained silicon/SiGe with different architectures by Raman spectroscopy	2005
Kai Wang Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill Sorin Soare et al.	Calibration of MEMS-based test structures for predicting thermomechanical stress in integrated circuit interconnect structures	2005
Rimoon Agaiby Professor Anthony O'Neill Dr Sarah Olsen	Design considerations for strained Si/SiGe deep submicron dual-channel CMOS using high thermal budgets	2005
Dr Sanatan Chattopadhyay Professor Alex Yakovlev Emeritus Professor Satnam Dlay Professor Anthony O'Neill	Design ofsrained silicon inverters for fture VLSI applications	2005
Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al.	Doubling speed using strained Si/SiGe CMOS technology	2005
Praneet Bhatnagar Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill Dr Konstantin Vasilevskiy et al.	Effective edge termination design in SiCVJFET	2005
Irina Nikitina Dr Konstantin Vasilevskiy Professor Nick Wright Dr Alton Horsfall Professor Anthony O'Neill et al.	Formation and role of graphite and nickel silicide in nickel based ohmic contacts to n -type silicon carbide	2005
Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Goutan Dalapati et al.	Fowler-Nordheim tunnelling in strained Si/SiGe MOS devices: impact of cross-hatching and nanoscale roughness	2005
Dr Sarah Olsen Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al.	High performance strained Si.SiGe n-channel MOSFETs: impact of alloy composition and layer architecture	2005
Dr Sarah Olsen Dr Piotr Dobrosz Dr Enrique Escobedo-Cousin Professor Steve Bull Professor Anthony O'Neill et al.	Mobility-limiting mechanisms in single and dual channel strained Si/SiGe MOSFETs	2005
Rudra Dhar Goutan Dalapati Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen et al.	Modelling of self-heating in strained Si n-channel MOSFETs on SiGe virtual substrates	2005
Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al.	Obtaining mechanical parameters for metallisation stress sensor design using nanoindentation	2005
Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al.	Obtaining mechanical parameters for metallisation stress sensor design using nanoindentation	2005
Professor Steve Bull Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	On the relationship between electrical performance and Raman spectroscopic results for strained Si/SiGe devices	2005
Praneet Bhatnagar Dr Alton Horsfall Professor Nick Wright Dr Christopher Johnson Dr Konstantin Vasilevskiy et al.	Optimisation of a 4H-SiC enhancement mode power JFET for high temperature operation	2005
Chia-Ching Chen Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill	Optimisation of heterostructure bipolar transistors in SiC	2005
Chia-Ching Chen Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill	Optimisation of Heterostructure Bipolar Transistors in SiC	2005
Arup Saha Dr Alton Horsfall Dr Sanatan Chattopadhyay Professor Nick Wright Professor Anthony O'Neill et al.	Prediction of barrier inhomogeneities and carrier transport in Ni-silicided Schottky diode	2005
Dr Konstantin Vasilevskiy Professor Nick Wright Irina Nikitina Dr Alton Horsfall Professor Anthony O'Neill et al.	Protection of selectively implanted and patterned silicon carbide surfaces with graphite capping layer during post-implantation annealing	2005
Dr Sarah Olsen Professor Anthony O'Neill	Quantitative analysis of gate-oxide interface roughening in SiGe/Si virtual substrate-based transistor device structures	2005
Cezar Blasciuc-Dimitriu Dr Alton Horsfall Professor Nick Wright Dr Christopher Johnson Dr Konstantin Vasilevskiy et al.	Quantum modelling of I-V characteristics for 4H-SiC Schottky barrier diodes	2005
Dr Alton Horsfall Professor Nick Wright Sorin Soare Professor Steve Bull Professor Anthony O'Neill et al.	Sensitivity of a rotating beam sensor for stress evaluation in aluminium thin films	2005
Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa Dr Jie Zhang et al.	Strained Si/SiGe CMOS: high performance without re-tooling	2005
Dr Sarah Olsen Professor Anthony O'Neill	Strained-Si NMOSFETs on thin 200 nm virtual substrates	2005
Dr Sarah Olsen Professor Anthony O'Neill Dr Piotr Dobrosz Professor Steve Bull Luke Driscoll et al.	Study of strain relaxation in Si/SiGe metal-oxide-semiconductor field-effect transistors	2005
Dr Alton Horsfall Sorin Soare Professor Nick Wright Professor Anthony O'Neill Professor Steve Bull et al.	Test chip for the development and evaluation of sensors for measuring stress in metal interconnects	2005
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	The use of Raman spectroscopy to identify strain and strain relaxation in strained Si/SiGe structures	2005
Dr Nebojsa Jankovic Professor Professor Anthony O'Neill	2D device-level simulation study of strained-Si pnp heterojunction bipolar transistors on virtual substrates	2004
Dr Sarah Olsen Professor Anthony O'Neill	3D determination of a MOSFET gate morphology by FIB tomography	2004
Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill Sorin Soare Professor Steve Bull et al.	Calibration and optimization of interconnect based MEMS test structures for predicting thermo-mechanical stress in metallization	2004
Dr Alton Horsfall Sorin Soare Professor Steve Bull Professor Nick Wright Professor Anthony O'Neill et al.	Dependence of process parameters on stress generation in aluminum thin films	2004
Dr Sarah Olsen Dr Kelvin Kwa Luke Driscoll Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al.	Design, fabrication and characterisation of strained Si/SiGe MOS transistors	2004
Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al.	Determination of mechanical parameters for rotating MEMS structures as a function of deposition method	2004
Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al.	Determination of mechanical parameters for rotating MEMS structures as a function of deposition method	2004
Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al.	Evaluation of strained Si/SiGe material for high performance CMOS	2004
Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al.	Evaluation of strained Si/SiGe material for high performance CMOS	2004
Dr Alton Horsfall Professor Nick Wright Dr Christopher Johnson Dr Konstantin Vasilevskiy Professor Anthony O'Neill et al.	First principles derivation of carrier transport across metal - SiC barriers	2004
Luke Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al.	Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters	2004
Lynn Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al.	Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters	2004
Luke Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al.	Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters	2004
Luke Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al.	Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters	2004
Dr Sarah Olsen Professor Anthony O'Neill	Measurement of Relaxation in Strained Silicon by Grazing Incidence In-plane X-ray Diffraction	2004
Dr Sarah Olsen Professor Anthony O'Neill	Measurement of relaxation in strained silicon by grazing incidence in-plane x-ray diffraction	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the Residual Macro and Microstrain in Strained Si/SiGe using Raman Spectroscopy Z Metal	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the residual strain in strained Si/SiGe using Raman spectroscopy	2004
Dr Sarah Olsen Professor Anthony O'Neill	Measurements of gate-oxide interface roughness in strained-Si virtual substrate SiGe/Si MOSFET device structures	2004
Sorin Soare Professor Steve Bull Professor Anthony O'Neill Professor Nick Wright Dr Alton Horsfall et al.	Nanoindentation assessment of aluminium metallisation; the effect of creep and pile-up	2004
Dr Sarah Olsen Professor Anthony O'Neill Luke Driscoll Dr Sanatan Chattopadhyay Dr Kelvin Kwa et al.	Optimization of alloy composition for high-performance strained-Si-SiGe N-channel MOSFETs	2004
Dr Nebojsa Jankovic Professor Professor Anthony O'Neill	Performance evaluation of SiGe heterojunction bipolar transistors on virtual substrates	2004
Dr Sarah Olsen Professor Anthony O'Neill Dr Jun Zhang	Si-Based Heterojunctions and Strained Si: Growth, Characterization and Applications	2004
Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill	Strained Si MOSFETs on relaxed SiGe platforms: Performance and challenges	2004
Dr Sarah Olsen Dr Kelvin Kwa Dr Sanatan Chattopadhyay Luke Driscoll Professor Anthony O'Neill et al.	Strained Si/SiGe n-channel MISFETs	2004
Dr Sarah Olsen Professor Anthony O'Neill	Strained-Si n-MOS surface-channel and buried Si0.7Ge 0.3 compressively-strained p-MOS fabricated in a 0.25 μm heterostructure CMOS process	2004
Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Luke Driscoll Dr Kelvin Kwa et al.	Study of single- and dual-channel designs for high-performance strained-Si-SiGe n-MOSFETs	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Technique for measuring the residual strain in strained Si/SiGe MOSFET structures using Raman spectroscopy	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Technique for measuring the residual strain in strained Si/SiGe MOSFET structures using Raman spectroscopy	2004
Dr Sarah Olsen Professor Anthony O'Neill	Temperature dependence of submicrometer strained-Si surface channel n-type MOSFETs in DT mode	2004
Dr Sarah Olsen Professor Anthony O'Neill	Temperature sensitivity of DC operation of sub-micron strained-Si MOSFETs	2004
Dr Alton Horsfall Sorin Soare Professor Nick Wright Professor Anthony O'Neill Professor Steve Bull et al.	Test chip for the development and evaluation of test structures for measuring stress in metal interconnect	2004
Dr Sarah Olsen Professor Anthony O'Neill Professor Steve Bull Dr Sanatan Chattopadhyay Dr Kelvin Kwa et al.	Thermal oxidation of strained Si/SiGe: impact of surface morphology and effect on MOS devices	2004
Dr Sarah Olsen Professor Anthony O'Neill	3D determination of a MOSFET gate morphology by FIB tomography	2003
Dr Kelvin Kwa Dr Sanatan Chattopadhyay Dr Nebojsa Jankovic Professor Dr Sarah Olsen Luke Driscoll et al.	A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics	2003
Dr Alton Horsfall Sorin Soare Professor Nick Wright Professor Anthony O'Neill Professor Steve Bull et al.	A novel sensor for the direct measurement of process induced residual stress in interconnects	2003
Sorin Soare Professor Steve Bull Dr Alton Horsfall Joana Santos Professor Anthony O'Neill et al.	Assessment of aluminium thin films by nanindentation	2003
Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al.	Capacitance - Voltage Characterization of Strained Si/SiGe Multiple Heterojunction Capacitors as a Tool for Heterojunction Metal Oxide Semiconductor Field Effect Transistor Channel Design	2003
Cezar Blasciuc-Dimitriu Dr Alton Horsfall Dr Konstantin Vasilevskiy Dr Christopher Johnson Professor Nick Wright et al.	Characterisation of the High Temperature Performance of 4H-SiC Schottky Barrier Diodes	2003
Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al.	C-V characterization of strained Si/SiGe multiple heterojunction capacitors as a tool for heterojunction MOSFET channel design	2003
Professor Anthony O'Neill Dr Sarah Olsen	Design, Fabrication and Characterisation of Strained Si/SiGe MOSFETs	2003
Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Nicola Wright et al.	Determination of mechanical parameters for rotatin MEMS as function of deposition method	2003
Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al.	Determination of mechanical parameters for rotating MEMS as a function of deposition method	2003
Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al.	Determination of mechanical parameters for rotating MEMS structures as a function of deposition method	2003
Dr Alton Horsfall Sorin Soare Professor Nick Wright Professor Anthony O'Neill Professor Steve Bull et al.	Direct measurement of residual stress in sub-micron interconnects	2003
Dr Nebojsa Jankovic Professor Professor Anthony O'Neill	Enhanced performance virtual substrate heterojunction bipolar transistor using strained-Si/SiGe emitter	2003
Dr Sarah Olsen Professor Anthony O'Neill	Gate-oxide interface roughness analyses for oxidation on strained and unstrained vicinal Si surfaces by transmission electron microscopy	2003
Dr Sarah Olsen Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al.	High performance strained Si.SiGe NMOSFETs using a novel CMOS architecture	2003
Dr Sarah Olsen Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al.	High performance strained Si/SiGe n-channel MOSFETs: impact of alloy composition and layer architecture	2003
Dr Sarah Olsen Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al.	High performance strained Si/SiGe nMOSFETs using a novel CMOS architecture	2003
Dr Sarah Olsen Professor Anthony O'Neill Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay et al.	High-performance nMOSFETs using a novel strained Si/SiGe CMOS architecture	2003
Sorin Soare Dr Alton Horsfall Professor Steve Bull Professor Nick Wright Dr Adrian Oila et al.	Hinge optimisation in a micro-rotating structure for stress gauging in integrated circuit interconnects	2003
Sorin Soare Professor Steve Bull Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al.	Hinge sensitivity in a micro-rotating structure for predicting induced thermo mechanical stress in integrated circuit metal interconnects	2003
Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al.	Impact of virtual substrate Ge composition on strained Si MOSFET performance	2003
Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll Professor Steve Bull et al.	Impact of Virtual Substrate Ge Composition on Strained Si MOSFET Performance	2003
Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al.	Impact of virtual substrate growth on high performance strained Si/SiGe double quantum well metal-oxide-semiconductor field-effect transistors	2003
Dr Sarah Olsen Professor Anthony O'Neill	Impact of virtual substrate quality on performance enhancements in strained Si/SiGe heterojunction n-channel MOSFETs	2003
Dr Sarah Olsen Professor Anthony O'Neill	Impact of virtual substrate quality on performance enhancements in strained Si/SiGe heterojunction n-channel MOSFETs	2003
Dr Sarah Olsen Professor Anthony O'Neill Dr Jie Zhang	Measurements of gate-oxide interface roughness in strained-Si virtual substrate SiGe/Si MOSFET device structures	2003
Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Luke Driscoll Dr Kelvin Kwa et al.	N-MOSFET performance in single and dual channel strained Si/SiGe CMOS architectures	2003
Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill	Optimisation of a 4H-SiC enhancement mode power JFET	2003
Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill	Optimisation of a 4H-SiC Enhancement Mode Power JFET	2003
Dr Kelvin Kwa Dr Sanatan Chattopadhyay Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al.	Optimisation of channel thickness in strained Si/SiGe MOSFETs	2003
Dr Kelvin Kwa Dr Sanatan Chattopadhyay Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al.	Optimisation of Channel Thickness in Strained Si/SiGe MOSFETs	2003
Dr Kelvin Kwa Dr Sanatan Chattopadhyay Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al.	Optimisation of channel thickness in strained Si/SiGe MOSFETs	2003
Dr Nebojsa Jankovic Professor Professor Anthony O'Neill	Performance evaluation of SiGe HBTs on virtual substrates	2003
Professor Anthony O'Neill	Propagation of x-rays in carbon nanotubes	2003
Professor Anthony O'Neill	Propagation of X-rays in carbon nanotubes	2003
Professor Anthony O'Neill	Propagation of x-rays in carbon nanotubes	2003
Dr Alton Horsfall Sorin Soare Dr Adrian Oila Professor Steve Bull Professor Nick Wright et al.	Residual Stress Sensor for the Microelectronics Industry	2003
Professor Anthony O'Neill Dr Jun Zhang	The relative performance enhancement of strained-Si and buried channel p-MOS as a function of lithographic and effective gate lengths	2003
Dr Konstantin Vasilevskiy Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al.	4H-SiC rectifiers with dual metal planar Schottky contacts	2002
Dr Konstantin Vasilevskiy Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al.	4H-SiC Schottky diodes with high on/off current ratio	2002
Dr Konstantin Vasilevskiy Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al.	4H-SiC Schottky diodes with high on/off current ratio	2002
Sorin Soare Professor Steve Bull Professor Anthony O'Neill Professor Nick Wright	Assessment of aluminium metallisation by nanoindentation	2002
Cezar Blasciuc-Dimitriu Dr Alton Horsfall Dr Konstantin Vasilevskiy Dr Christopher Johnson Professor Nick Wright et al.	Characterisation of the high temperature performance of 4H-SiC Schottky barrier diodes	2002
Stephen Badcock Professor Anthony O'Neill Dr Graeme Chester	Device and circuit performance of SiGe/Si MOSFETs	2002
Stephen Badcock Professor Anthony O'Neill Dr Graeme Chester	Device and Circuit Performance of SiGe/Si MOSFETs	2002
Dr Sarah Olsen Professor Anthony O'Neill Professor Steve Bull	Effect of metal-oxide-semiconductor processing on the surface rouhness of strained Si/SiGe material	2002
Dr Gordon Phelps Professor Nick Wright Dr Graeme Chester Dr Christopher Johnson Professor Anthony O'Neill et al.	Enhanced dopant diffusion effects in 4H silicon carbide	2002
Dr Gordon Phelps Professor Nick Wright Dr Graeme Chester Dr Christopher Johnson Professor Anthony O'Neill et al.	Enhanced nitrogen diffusion in 4H-SiC	2002
Dr Gordon Phelps Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Sylvie Ortolland et al.	Enhanced nitrogen diffusion in 4H-SiC	2002
Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the nanoscale roughness of advanced MOSFET layer structures	2002
Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the nanoscale roughness of advanced MOSFET layer structures	2002
Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill	Optimisation of a 4H-SiC enhancement mode power JFET	2002
Dr Alton Horsfall Dr Konstantin Vasilevskiy Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al.	Optimisation of implanted guard-ring terminations in 4H-SiC Schottky diodes	2002
Dr Alton Horsfall Dr Konstantin Vasilevskiy Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al.	Optimisation of implanted guard-ring terminations in 4H-SiC Schottky diodes	2002
Dr Gordon Phelps Professor Nick Wright Dr Graeme Chester Dr Christopher Johnson Professor Anthony O'Neill et al.	Step bunching fabrication constraints in silicon carbide	2002
Dr Sarah Olsen Professor Anthony O'Neill	Strained Si/SiGe n-channel MOSFETs: Impact of cross-hatching on device performance	2002
Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill	4H-SiC Schottky diodes with high on-off current ratio	2001
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland et al.	Physical characterization of residual implant damage in 4H-SiC double implanted bipolar technology	2001
Dr Christopher Johnson Professor Nick Wright Dominique Morrison Dr Alton Horsfall Dr Sylvie Ortolland et al.	Recent progress and current issues in SiC semiconductor devices for power applications	2001
Stephen Badcock Professor Anthony O'Neill	SiGe HMOSFET differential pair	2001
Dominique Morrison Professor Nick Wright Dr Alton Horsfall Dr Christopher Johnson Professor Anthony O'Neill et al.	Effect of post-implantation anneal on the electrical characteristics of Ni 4H-SiC Schottky barrier diodes terminated using self-aligned argon ion implantation	2000
Dr Mohamad Hossin Professor Nick Wright Professor Anthony O'Neill	Evaluation of GaAs Schottky gate bipolar transistor (SGBT) by electrothermal simulation	2000
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland et al.	Implanted bipolar technology in 4H-SiC	2000
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland et al.	Implanted bipolar technology in 4H-SiC	2000
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Kazuhiro Adachi et al.	Implanted bipolar technology in 4H-SiC	2000
Dominique Morrison Professor Nick Wright Dr Sylvie Ortolland Dr Christopher Johnson Professor Anthony O'Neill et al.	Low temperature annealing of 4H-SiC Schottky diode edge terminations 4 formed by 30 keV Ar+ implantation	2000
Stephen Badcock Professor Anthony O'Neill	Material requirements and design considerations for Si/SiGe heterojunction CMOS	2000
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland et al.	Physical characterization of residual implant damage in 4H-SiC double implanted bipolar technology	2000
Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland Kazuhiro Adachi et al.	Physical characterization of residual implant damage in 4H-SiC double implanted bipolar technology	2000
Dominique Morrison Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill	Surface preparation for Schottky metal - 4H-SiC contacts formed on plasma-etched SiC	2000
Kazuhiro Adachi Dr Christopher Johnson Dr Sylvie Ortolland Professor Anthony O'Neill	TCAD evaluation of double implanted 4H-SiC power bipolar transistors	2000
Dominique Morrison Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill	Anomalous forward I-V characteristics of Ti/Au SiC Schottky barrier diodes	1999
Dominique Morrison Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill	Anomalous forward I-V characteristics of Ti/Au SiC Schottky barrier diodes	1999
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill	Cell geometry optimisation of 4H-SiC power UMOSFETs by electrothermal simulation	1999
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill	Cell geometry optimisation of 4H-SiC UMOSFETs by electrothernal simulation	1999
Professor Anthony O'Neill	Electromigration testing of via terminated test structures	1999
Professor Anthony O'Neill Dr Christopher Johnson	Evaluation of 4H-SiC varactor diodes for microwave applications	1999
Dr Christopher Johnson Professor Anthony O'Neill	Mechanistic model for oxidation of SiC	1999
Dr Sylvie Ortolland Dr Christopher Johnson Professor Nick Wright Dominique Morrison Professor Anthony O'Neill et al.	Optimisation of a power 4H-SiC SIT device for RF heating applications	1999
Dr Sylvie Ortolland Dr Christopher Johnson Dominique Morrison Professor Anthony O'Neill	Optimisation of a power 4H-SiC SIT device for RF heating applications	1999
Dr Christopher Johnson Professor Anthony O'Neill	Oxidation modelling for SiC	1999
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill	Oxidation modelling for SiC	1999
Professor Anthony O'Neill	Reliability studies of Cu using wafer level joule heated electromigration test	1999
Professor Anthony O'Neill	SiGe virtual substrate N-channel heterojunction MOSFETs	1999
Kazuhiro Adachi Dr Christopher Johnson Dr Sylvie Ortolland Professor Nick Wright Professor Anthony O'Neill et al.	TCAD evaluation of double implanted 4H-SiC power bipolar transistors	1999
Dominique Morrison Dr Christopher Johnson Professor Anthony O'Neill Dr Sylvie Ortolland	The effect of annealing on argon implanted edge terminations for 4H-SiC Schottky diodes	1999
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill	Sulphur based surface passivation for high voltage GaAS Schottky diodes	1998
Professor Steve Bull Professor Anthony O'Neill	Simple computer modeling of the grain microstructure of Al-4wt%Cu interconnection lines	1997