Merve Yakut Atreyee Roy Dr Jake Sheriff Dr Sarah Olsen Dr Konstantin Vasilevskiy et al. | Increasing Mobility in 4H-SiC MOSFETs with Deposited Oxide by In Situ Nitridation of SiC Surface | 2024 |
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Emily Johnson Dr Rolando Berlinguer Palmini Hongze Zhong Zhong Dr Johannes Gausden Dr Richard Bailey et al. | Optogenetic Multiphysical Fields Coupling Model for Implantable Neuroprosthetic Probes | 2024 |
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Dr Boubker Zaaimi Mark Turnbull Dr Anupam Hazra Professor Yujiang Wang Dr Carolina Gandara De Souza et al. | Closed-loop optogenetic control of normal and pathological network dynamics | 2023 |
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Dr Boubker Zaaimi Mark Turnbull Dr Anupam Hazra Professor Yujiang Wang Dr Carolina Gandara de Souza et al. | Closed-loop optogenetic control of the dynamics of neural activity in non-human primates | 2023 |
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Dr Enrique Escobedo-Cousin Dr Johannes Gausden Professor Anthony O'Neill
| Voiding in Parylene-C Encapsulation of Surface Mount LEDs for an Optogenetic Epilepsy Neuroprosthesis | 2023 |
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Dr Stuart Maitland Dr Enrique Escobedo-Cousin Dr Ian Schofield Professor Anthony O'Neill Professor Stuart Baker et al. | Electrical cross-sectional imaging of human motor units in vivo | 2022 |
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Dimitrios Firfilionis Frances Hutchings Dr Reza Tamadoni Jahromi Dr Darren Walsh Mark Turnbull et al. | A Closed-Loop Optogenetic Platform | 2021 |
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Dr Guangru Zhang Dr Dragos Neagu Dr Peter King Professor Anthony O'Neill Professor Ian Metcalfe et al. | The effects of sulphur poisoning on the microstructure, composition andoxygen transport properties of perovskite membranes coated withnanoscale alumina layers | 2021 |
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Dr Zi Jie Choong Dr Dehong Huo Dr Nilhil Ponon Rachael Savidis Professor Patrick Degenaar et al. | A novel hybrid technique to fabricate silicon-based micro-implants with near defect-free quality for neuroprosthetics application | 2020 |
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Dimitrios Firfilionis Dr Wei Xu Dr Darren Walsh Dr Enrique Escobedo-Cousin Dr Reza Ramezani et al. | The Neural Engine: A Reprogrammable Low Power Platform for Closed-loop Optogenetics | 2020 |
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Dr Emma Brunton Dr Enrique Escobedo-Cousin Dr Gaurav Gupta Professor Roger Whittaker Professor Anthony O'Neill et al. | W:Ti flexible transversal electrode array for peripheral nerve stimulation: A feasibility study | 2020 |
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Dr Jesus Urresti Ibanez Dr Sarah Olsen Professor Nick Wright Professor Anthony O'Neill
| Design and Analysis of High Mobility Enhancement Mode 4H-SiC MOSFETs Using a Thin SiO2 / Al2O3 Gate Stack | 2019 |
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Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill
| Edge chipping minimisation strategy for milling of monocrystalline silicon: A molecular dynamics study | 2019 |
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Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill
| Micro-machinability and edge chipping mechanism studies on diamond micro-milling of monocrystalline silicon | 2019 |
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Professor Anthony O'Neill Faiz Arith Dr Jesus Urresti Ibanez Dr Konstantin Vasilevskiy Professor Nick Wright et al. | High Mobility 4H-SiC MOSFET | 2018 |
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Faiz Arith Dr Jesus Urresti Ibanez Dr Konstantin Vasilevskiy Dr Sarah Olsen Professor Nick Wright et al. | High mobility 4H-SiC MOSFET using a thin SiO2/Al2O3 gate stack | 2018 |
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Faiz Arith Dr Jesus Urresti Ibanez Dr Konstantin Vasilevskiy Dr Sarah Olsen Professor Nick Wright et al. | Increased Mobility in Enhancement Mode 4H-SiC MOSFET Using a Thin SiO2 / Al2O3 Gate Stack | 2018 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Measurements of gate-oxide interface roughness in strained-Si virtual substrate SiGe/Si MOSFET device structures | 2018 |
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Dr Rolando Berlinguer Palmini Dr Nilhil Ponon Professor Anthony O'Neill Professor Patrick Degenaar
| Opto‐electro‐thermal optimization of photonic probes for optogenetic neural stimulation | 2018 |
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Dr Fahimeh Dehkhoda Dr Ahmed Abd El-Aal Dr Nilhil Ponon Professor Andrew Jackson Professor Anthony O'Neill et al. | Self-sensing of temperature rises on light emitting diode based optrodes | 2018 |
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Sandip Roy Dr Jesus Urresti Ibanez Professor Anthony O'Neill Professor Nick Wright Dr Alton Horsfall et al. | Characterisation of 4H-SiC MOS capacitor with a protective coating for harsh environments applications | 2017 |
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Dr Fahimeh Dehkhoda Dr Ahmed Abd El-Aal Dr Nilhil Ponon Professor Anthony O'Neill Professor Patrick Degenaar et al. | LED-Based Temperature Sensor | 2017 |
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Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill
| Micro-machining of monocrystalline silicon with improved edge quality | 2017 |
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Srinivas Ganti Dr Peter King Dr Erhan Arac Dr Billy Murdoch Professor Peter Cumpson et al. | Voltage Controlled Hot Carrier Injection Enables Ohmic Contacts Using Au Island Metal Films on Ge | 2017 |
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Harbaljit Sohal Dr Konstantin Vasilevskiy Professor Andrew Jackson Professor Stuart Baker Professor Anthony O'Neill et al. | Design and Microfabrication Considerations for Reliable Flexible Intracortical Implants | 2016 |
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Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill
| Effect of crystallographic orientation and employment of different cutting tools on micro-end-milling of monocrystalline silicon | 2016 |
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Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill
| Investigation of edge-chipping reduction on silicon micro-milling | 2016 |
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Harbaljit Sohal Dr Gavin Clowry Professor Andrew Jackson Professor Anthony O'Neill Professor Stuart Baker et al. | Mechanical Flexibility Reduces the Foreign Body Response to Long-Term Implanted Microelectrodes in Rabbit Cortex | 2016 |
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Dr Zi Jie Choong Dr Dehong Huo Professor Patrick Degenaar Professor Anthony O'Neill
| Micro-Machinability Studies of Single Crystal Silicon Using Diamond End-Mill | 2016 |
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Sami Ramadan Dr Kelvin Kwa Dr Peter King Professor Anthony O'Neill
| Reliable Fabrication of Sub-10 nm Silicon Nanowires by Optical Lithography | 2016 |
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Professor Anthony O'Neill
| (Invited) Negative Capacitance Using Ferroelectrics for Future Steep-Slope MOSFETS | 2015 |
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Dr Nilhil Ponon Dan Appleby Dr Erhan Arac Dr Peter King Srinivas Ganti et al. | Effect of deposition conditions and post deposition anneal on reactively sputtered titanium nitride thin films | 2015 |
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Dr Enrique Escobedo-Cousin Dr Peter King Professor Anthony O'Neill Dr Alton Horsfall Professor Jon Goss et al. | Electrical Characterization of Epitaxial Graphene Field-Effect Transistors with High-k Al2O3 Gate Dielectric Fabricated on SiC Substrates | 2015 |
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Dr Toby Hopf Dr Konstantin Vasilevskiy Dr Enrique Escobedo-Cousin Dr Alton Horsfall Professor Jon Goss et al. | Facile technique for the removal of metal contamination from graphene | 2015 |
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Dr Toby Hopf Dr Konstantin Vasilevskiy Enrique Escobedo-Cousin Professor Nick Wright Dr Alton Horsfall et al. | Determination of the adhesion energy of graphene on SiC(0001) via measurement of pleat defects | 2014 |
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Dr Toby Hopf Dr Konstantin Vasilevskiy Dr Enrique Escobedo-Cousin Dr Peter King Professor Nick Wright et al. | Dirac point and transconductance of top-gated graphene field-effect transistors operating at elevated temperature | 2014 |
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Nor Za'bah Dr Kelvin Kwa Professor Anthony O'Neill
| Electrical characterisation of highly doped triangular silicon nanowires | 2014 |
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Dan Appleby Dr Nilhil Ponon Dr Kelvin Kwa Professor Anthony O'Neill
| Experimental Observation of Negative Capacitance in Ferroelectrics at Room Temperature | 2014 |
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Dr Peter King Dr Erhan Arac Srinivas Ganti Sami Ramadan Dr Kelvin Kwa et al. | Fermi Level De-pinning In Metal-Semiconductor Contacts Via Nanometre-scale ALD Dielectric Films | 2014 |
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Dan Appleby Dr Nilhil Ponon Dr Kelvin Kwa Srinivas Ganti Professor Anthony O'Neill et al. | Ferroelectric properties in thin film barium titanate grown using pulsed laser deposition | 2014 |
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Dr Nilhil Ponon Dan Appleby Dr Erhan Arac Dr Kelvin Kwa Professor Jon Goss et al. | Impact of Crystalline Orientation on the Switching Field in Barium Titanate Using Piezoresponse Force Spectroscopy | 2014 |
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Dr Peter King Dr Erhan Arac Srinivas Ganti Dr Kelvin Kwa Dr Nilhil Ponon et al. | Improving metal/semiconductor conductivity using AlOx interlayers on n-type and p-type Si | 2014 |
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Dr Toby Hopf Dr Konstantin Vasilevskiy Dr Enrique Escobedo-Cousin Professor Anthony O'Neill Dr Alton Horsfall et al. | Optimizing the vacuum growth of epitaxial graphene on 6H-SiC | 2014 |
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Dr Enrique Escobedo-Cousin Dr Toby Hopf Professor Nick Wright Professor Anthony O'Neill Dr Alton Horsfall et al. | Solid phase growth of graphene on silicon carbide by nickel silicidation: graphene formation mechanisms | 2014 |
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Dr Enrique Escobedo-Cousin Dr Konstantin Vasilevskiy Dr Toby Hopf Professor Nick Wright Professor Anthony O'Neill et al. | Solid Phase Growth of Graphene on Silicon Carbide by Nickel Silicidation: Graphene Formation Mechanisms | 2014 |
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Harbaljit Sohal Professor Andrew Jackson Dr Gavin Clowry Dr Konstantin Vasilevskiy Professor Anthony O'Neill et al. | The sinusoidal probe: a new approach to improve electrode longevity | 2014 |
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Professor Anthony O'Neill Dan Appleby Dr Nilhil Ponon Dr Kelvin Kwa
| Towards steep slope MOSFETs using ferroelectric negative capacitance | 2014 |
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Raied Al-Hamadany Professor Jon Goss Professor Patrick Briddon Professor Anthony O'Neill Dr Mark Rayson et al. | Impact of tensile strain on the oxygen vacancy migration in SrTiO3: Density functional theory calculations | 2013 |
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Dr Enrique Escobedo-Cousin Dr Konstantin Vasilevskiy Dr Toby Hopf Professor Nick Wright Professor Anthony O'Neill et al. | Local solid phase growth of few-layer graphene on silicon carbide from nickel silicide supersaturated with carbon | 2013 |
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Dr Enrique Escobedo-Cousin Dr Toby Hopf Professor Anthony O'Neill Dr Alton Horsfall Professor Jon Goss et al. | Optimising the Growth of Few-Layer Graphene on Silicone Carbide by Nickel Silicidation | 2013 |
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Raied Al-Hamadany Professor Jon Goss Professor Patrick Briddon Meaad Al-Hadidi Professor Anthony O'Neill et al. | Oxygen vacancy migration in compressively strained SrTiO3 | 2013 |
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Nor Za'bah Dr Kelvin Kwa Professor Anthony O'Neill
| The study on the aspect ratio of Atomic Force Microscope (AFM) measurements for triangular silicon nanowire | 2013 |
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Dr Kelvin Kwa Professor Jon Goss Dr Zhiyong Zhou Dr Nilhil Ponon Dan Appleby et al. | A comprehensive study on the leakage current mechanisms of Pt/SrTiO3/Pt capacitor | 2012 |
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Professor Jon Goss Dr Kelvin Kwa Professor Anthony O'Neill
| Anomalous resistive switching phenomenon | 2012 |
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Dr Nilhil Ponon Dan Appleby Dr Kelvin Kwa Professor Anthony O'Neill
| Ferroelectrics for nanoelectronics | 2012 |
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Professor Jon Goss Dr Kelvin Kwa Raied Al-Hamadany Dan Appleby Dr Nilhil Ponon et al. | Leakage current asymmetry and resistive switching behavior of SrTiO3 | 2012 |
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Dr Enrique Escobedo-Cousin Dr Konstantin Vasilevskiy Irina Nikitina Professor Nick Wright Professor Anthony O'Neill et al. | Local Solid Phase Epitaxy of Few-Layer Graphene on Silicon Carbide | 2012 |
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Nor Za'bah Dr Kelvin Kwa Professor Anthony O'Neill
| Top-down fabrication of single crystal silicon nanowire using optical lithography | 2012 |
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Mouhsine Fjer Dr Stefan Persson Dr Enrique Escobedo-Cousin Professor Anthony O'Neill
| Low Frequency Noise in Strained Si Heterojunction Bipolar Transistors | 2011 |
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Harbaljit Sohal Professor Andrew Jackson Robert Jackson Dr Konstantin Vasilevskiy Dr Gavin Clowry et al. | A novel flexible sinusoidal electrode to enhance longevity of chronic neuronal recordings | 2010 |
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Dr Barry Gallacher Professor Steve Bull Dr Alton Horsfall Professor Anthony O'Neill
| Analysis and characterization of a mechanical sensor to monitor stress in interconnect features | 2010 |
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Rouzet Agaiby Dr Sarah Olsen Professor Anthony O'Neill
| Direct measurement of MOSFET channel strain by means of backside etching and Raman spectroscopy on long-channel devices | 2010 |
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Layi Alatise Dr Sarah Olsen Professor Anthony O'Neill
| Improved self-gain in deep submicrometer strained silicon-germanium pMOSFETs with HfSiOx/TiSiN gate stacks | 2010 |
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Dr Alton Horsfall Professor Anthony O'Neill
| In situ X-ray diffraction study of self-forming barriers from a Cu-Mn alloy in 100 nm Cu/Iow-k damascene interconnects using synchrotron radiation | 2010 |
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Dr Alton Horsfall Professor Anthony O'Neill
| In situ X-ray diffraction study of self-forming barriers from a Cu-Mn alloy in 100 nm Cu/low-k damascene interconnects using synchrotron radiation | 2010 |
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Dr Basel Halak Professor Alex Yakovlev Professor Anthony O'Neill
| Is a single cell sensor possible? | 2010 |
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Layi Alatise Dr Sarah Olsen Professor Anthony O'Neill
| Linearity and mobility degradation in strained Si MOSFETs with thin gate dielectrics | 2010 |
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Dr Stefan Persson Mouhsine Fjer Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Anthony O'Neill et al. | Strained-Silicon Heterojunction Bipolar Transistor | 2010 |
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Layi Alatise Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill
| The impact of self-heating and SiGe strain-relaxed buffer thickness on the analog performance of strained Si nMOSFETs | 2010 |
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Professor Anthony O'Neill
| X-ray propagation in multiwall carbon nanotubes | 2010 |
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Liang Yan Dr Sarah Olsen Professor Anthony O'Neill
| 1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack | 2009 |
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Layi Alatise Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill
| A design methodology for maximizing the voltage gain of strained Si MOSFETs using the thickness of the silicon-germanium strain relaxed buffer as a design parameter | 2009 |
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Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill
| A NEMS-based sensor to monitor stress in deep sub-micron Cu/Low-k interconnects | 2009 |
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Christopher Wilson Professor Anthony O'Neill Dr Alton Horsfall
| Application of a Nano-Mechanical Sensor to Monitor Stress in Copper Damascene Interconnects | 2009 |
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Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Anthony O'Neill
| Defect identification in strained Si/SiGe heterolayers for device applications | 2009 |
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Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill
| Demonstration of a Sub-micron Damascene Cu/Low-k Mechanical Sensor to Monitor Stress in BEOL Metallization | 2009 |
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Layi Alatise Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill
| Improved Analog Performance in Strained-Si MOSFETs Using the Thickness of the Silicon-Germanium Strain-Relaxed Buffer as a Design Parameter | 2009 |
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Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill
| Optimization of the channel lateral strain profile for improved performance of multi-gate MOSFETs | 2009 |
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Dr Sarah Olsen Professor Nick Cowern Professor Anthony O'Neill
| Performance Enhancements in Scaled Strained-SiGe pMOSFETs With HfSiOx/TiSiN Gate Stacks | 2009 |
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Irina Nikitina Dr Konstantin Vasilevskiy Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al. | Phase composition and electrical characteristics of nickel silicide Schottky contacts formed on 4H-SiC | 2009 |
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Dr Konstantin Vasilevskiy Irina Nikitina Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al. | Silicon Carbide Static Induction Transistor with Implanted Buried Gate | 2009 |
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Dr Sarah Olsen Liang Yan Dr Enrique Escobedo-Cousin Professor Anthony O'Neill
| Strained Si/SiGe MOS technology: Improving gate dielectric integrity | 2009 |
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Dr Alton Horsfall Professor Anthony O'Neill
| Study of the effect of dielectric porosity on the stress in advanced Cu/low-k interconnects using x-ray diffraction | 2009 |
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Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill
| Synchrotron measurement of the effect of dielectric porosity and air gaps on the stress in advanced Cu/low-k interconnects | 2009 |
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Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill
| Synchrotron measurement of the effect of linewidth scaling on stress in advanced Cu/Low-k interconnects | 2009 |
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Dr Barry Gallacher Professor Anthony O'Neill Professor Steve Bull Dr Alton Horsfall
| Analysis of a passive sensor for predicting process-induced stress in advanced integrated circuit interconnect | 2008 |
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Professor Anthony O'Neill
| Analysis of self-heating effects in ultrathin-body SOI MOSFETs by device simulation | 2008 |
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Professor David Herbert Professor Anthony O'Neill
| Bragg scattering of x-rays in multiwalled carbon nanotubes | 2008 |
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Dr Stefan Persson Mouhsine Fjer Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Anthony O'Neill et al. | Fabrication and characterisation of strained Si heterojunction bipolar transistors on virtual substrates | 2008 |
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Layi Alatise Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill
| Improved Analog Performance of Strained Si n-MOSFETs on Thin SiGe Strained Relaxed Buffers | 2008 |
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Liang Yan Dr Sarah Olsen Dr Enrique Escobedo-Cousin Professor Anthony O'Neill
| Improved gate oxide integrity of strained Si n-channel metal oxide silicon field effect transistors using thin virtual substrates | 2008 |
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Professor Anthony O'Neill Dr Alton Horsfall
| Influence of barriers on the reliability of dual damascene copper contacts | 2008 |
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Professor Anthony O'Neill Dr Sarah Olsen
| Insight into the aggravated lifetime reliability in advanced MOSFETs with strained-Si channels on SiGe strain-relaxed buffers due to self-heating | 2008 |
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Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill
| Investigation of Strain Profile Optimization in gate-all-around suspended silicon nanowire FET | 2008 |
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Rouzet Agaiby Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill et al. | Nanometer Scale Strain Profiling Through Si-SiGe Heterolayers | 2008 |
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Rouzet Agaiby Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill et al. | Nanometer strain profiling through Si/SiGe quantum layers | 2008 |
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Dr Sarah Olsen Dr Piotr Dobrosz Rouzet Agaiby Dr Yuk Tsang Layi Alatise et al. | Nanoscale strain characterisation for ultimate CMOS and beyond | 2008 |
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Dr Sarah Olsen Dr Piotr Dobrosz Rouzet Agaiby Dr Yuk Tsang Layi Alatise et al. | Nanoscale strain characterisation for ultimate CMOS and beyond | 2008 |
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Dr Piotr Dobrosz Dr Sarah Olsen Professor Steve Bull Dr Yuk Tsang Rouzet Agaiby et al. | Nanoscale strain characterisation in patterned SSOI structures | 2008 |
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Irina Nikitina Dr Konstantin Vasilevskiy Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al. | Phase Inhomogeneity and Electrical Characteristics of Nickel Silicide Schottky Contacts Formed on 4H-SiC | 2008 |
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Professor Anthony O'Neill Dr Yuk Tsang Dr Barry Gallacher Dr Sarah Olsen
| Piezomobility description of strain-induced mobility | 2008 |
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Professor Anthony O'Neill Rouzet Agaiby Dr Sarah Olsen Yang Yang
| Reduced self-heating by strained silicon substrate engineering | 2008 |
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Dr Sarah Olsen John Varzgar Dr Enrique Escobedo-Cousin Rouzet Agaiby Dr Piotr Dobrosz et al. | Strain engineering for high mobility channels | 2008 |
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Professor Andrew Houlton Dr Ben Horrocks Professor Nick Wright Dr Sarah Olsen Professor Anthony O'Neill et al. | Top down and Bottom-up Routes to Nanoscale Electronic Components | 2008 |
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Dr Yuk Tsang Professor Anthony O'Neill Dr Barry Gallacher Dr Sarah Olsen
| Using piezoresistance model with C-R conversion for modeling of strain-induced mobility | 2008 |
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Professor Anthony O'Neill Dr Sarah Olsen Yang Yang Rouzet Agaiby
| [invited] Engineering Self-Heating by Strained Silicon Technology | 2007 |
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Dr Alton Horsfall Professor Anthony O'Neill
| Application of CVD-W Diffusion Barrier Layers to Dual Damascene Copper Contacts | 2007 |
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Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill
| Bended gate-all-around nanowire MOSFET: A device with enhanced carrier mobility due to oxidation-induced tensile stress | 2007 |
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Dr Alton Horsfall Professor Steve Bull Professor Anthony O'Neill
| Comparative study of novel barrier layers in ULSI copper interconnects | 2007 |
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Christopher Wilson Dr Alton Horsfall Professor Anthony O'Neill Professor Nick Wright Professor Steve Bull et al. | Direct measurement of electromigration-induced stress in interconnect structures | 2007 |
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Professor Anthony O'Neill Dr Sarah Olsen Dr Yuk Tsang Dr Piotr Dobrosz
| Evolution of strain engineering for Si technology | 2007 |
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Dr Konstantin Vasilevskiy Irina Nikitina Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al. | High voltage silicon carbide schottky diodes with single zone junction termination extension | 2007 |
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Dr Yuk Tsang Dr Sanatan Chattopadhyay Dr Suresh Uppal Dr Enrique Escobedo-Cousin Deepak Ramakrishnan et al. | Modeling of the threshold voltage in strained Si/Si1-x Gex/S1-yGey(x ≥ y) CMOS architectures | 2007 |
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Rouzet Agaiby Yang Yang Dr Sarah Olsen Professor Anthony O'Neill
| Quantifying self-heating effects in strained Si MOSFETs with scaling | 2007 |
|
Rimoon Agaiby Yang Yang Dr Sarah Olsen Professor Anthony O'Neill
| Quantifying self-heating effects with scaling in globally strained Si MOSFETs | 2007 |
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Professor Anthony O'Neill Dr Sarah Olsen Yang Yang Rouzet Agaiby
| Reduced self-heating by strained Si substrate engineering | 2007 |
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Professor Anthony O'Neill Dr Sarah Olsen Rimoon Agaiby
| Reduced self-heating by strained Si substrate engineering | 2007 |
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Professor Anthony O'Neill Dr Sarah Olsen Yang Yang Rouzet Agaiby
| Reduced Self-Heating by Strained Silicon Substrate Engineering | 2007 |
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Dr Sarah Olsen Rouzet Agaiby Dr Enrique Escobedo-Cousin Professor Anthony O'Neill
| Strained Si/SiGe MOS technology: improving gate dielectric integrity | 2007 |
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Dr Sarah Olsen Dr Enrique Escobedo-Cousin Professor Anthony O'Neill
| Strained Si/SiGe MOS technology: Improving gate dielectric integrity | 2007 |
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Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Anthony O'Neill Layi Alatise Rouzet Agaiby et al. | Strained Si/strained SiGe/relaxed SiGe structures: identifying roughness due to compressed SiGe and its impact on high mobility MOSFETs | 2007 |
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Dr Enrique Escobedo-Cousin Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill et al. | Thermal stability of supercritical thickness-strained Si layers on thin strain-relaxed buffers | 2007 |
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Professor David Herbert Professor Anthony O'Neill
| X-ray propagation in carbon nanotubes | 2007 |
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Liang Yan Dr Sarah Olsen Dr Mehdi Kanoun Rimoon Agaiby Goutan Dalapati et al. | Analysis of gate leakage characteristics in strained Si MOSFETs | 2006 |
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Dr Sarah Olsen Dr Mehdi Kanoun Mohamed Al-Areeki Rimoon Agaiby Goutan Dalapati et al. | Analysis of gate leakage in strained Si MOSFETs | 2006 |
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Liang Yan Dr Sarah Olsen Dr Mehdi Kanoun Rimoon Agaiby Goutan Dalapati et al. | Analysis of Gate Leakage in Strained Si MOSFETs | 2006 |
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Dr Yuk Tsang Dr Sanatan Chattopadhyay Dr Kelvin Kwa Goutan Dalapati Rouzet Agaiby et al. | Analytical model for threshold voltage of p-MOSFET in strained-Si/SiGe dual channel architecture | 2006 |
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Praneet Bhatnagar Dr Alton Horsfall Professor Nick Wright Dr Christopher Johnson Dr Konstantin Vasilevskiy et al. | Analytical modelling of I-V characteristics for 4H-SiC enhancement mode VJFET | 2006 |
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Professor Anthony O'Neill
| Calibration of 4H-SiC TCAD models and material parameters | 2006 |
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Dr Sanatan Chattopadhyay John Varzgar Dr Johan Seger Dr Yuk Tsang Dr Kelvin Kwa et al. | Capacitance-voltage (C-V) technique for the characterisation of stained Si/Si1-xGex hetero-structure MOS devices | 2006 |
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Dr Sanatan Chattopadhyay John Varzgar Dr Johan Seger Dr Yuk Tsang Dr Kelvin Kwa et al. | Capacitance-voltage (C-V) technique for the characterisation of strained Si/Si1-xGex hetero-structure MOS devices | 2006 |
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Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rimoon Agaiby Dr Johan Seger et al. | Control of self-heating in thin virtual substrate strained Si MOSFETs | 2006 |
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Dr Konstantin Vasilevskiy Irina Nikitina Professor Nick Wright Dr Alton Horsfall Professor Anthony O'Neill et al. | Device processing and characterisation of high temperature silicon carbide Schottky diodes | 2006 |
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Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin Rimoon Agaiby Professor Steve Bull et al. | Device related characterisation techniques for Si/SiGe heterostructures | 2006 |
|
Professor Anthony O'Neill
| Device-related characterisation techniques for Si/SiGe heterosructures | 2006 |
|
Dr Alton Horsfall Professor Anthony O'Neill Professor Nick Wright Professor Steve Bull
| Direct measurement of electromigration induced stress in interconnect structures | 2006 |
|
Professor Anthony O'Neill Dr Sarah Olsen Dr Yuk Tsang Dr Piotr Dobrosz
| Evolution of strain engineering for Si technology | 2006 |
|
Goutan Dalapati Dr Sanatan Chattopadhyay Luke Driscoll Professor Anthony O'Neill Dr Kelvin Kwa et al. | Extraction and modelling of strained-Si MOSFET parameters using small signal channel conductance method | 2006 |
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Goutan Dalapati Dr Sanatan Chattopadhyay Luke Driscoll Professor Anthony O'Neill Dr Kelvin Kwa et al. | Extraction of strained-Si metal-oxide-semiconductor field-effect transistor parameters using small signal channel conductance method | 2006 |
|
Liang Yan Dr Sarah Olsen Dr Mehdi Kanoun Professor Anthony O'Neill
| Gate leakage mechanisms in strained Si devices | 2006 |
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John Varzgar Dr Mehdi Kanoun Dr Suresh Uppal Dr Sanatan Chattopadhyay Dr Sarah Olsen et al. | Gate Oxide Reliability of Strained Si NMOS Devices Employing a Thin SiFe Strain Relaxed Buffer | 2006 |
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John Varzgar Dr Sanatan Chattopadhyay Dr Suresh Uppal Dr Sarah Olsen Professor Anthony O'Neill et al. | Gate oxide reliability of strained Si NMOS devices employing a thin SiGe strain-relaxed buffer | 2006 |
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Dr Suresh Uppal John Varzgar Dr Sanatan Chattopadhyay Dr Sarah Olsen Professor Anthony O'Neill et al. | Gate oxide reliability of strained Si/SiGe MOS: effect of Ge content variation | 2006 |
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Dr Suresh Uppal John Varzgar Dr Mehdi Kanoun Dr Sanatan Chattopadhyay Dr Sarah Olsen et al. | Gate Oxide Reliability on strained Si/SiGe MOS: Effect of Ge content variation | 2006 |
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Dr Suresh Uppal Dr Mehdi Kanoun Dr Sanatan Chattopadhyay Rimoon Agaiby Dr Sarah Olsen et al. | Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices | 2006 |
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Dr Suresh Uppal Dr Mehdi Kanoun Dr Sanatan Chattopadhyay Rouzet Agaiby Dr Sarah Olsen et al. | Ge out-diffusion and its effect on electrical properties in s-Si/SiGe devices | 2006 |
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Dr Konstantin Vasilevskiy Irina Nikitina Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al. | High temperature operation of silicon carbide Schottky diodes with recoverable avalanche breakdown | 2006 |
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Dr Suresh Uppal Dr Mehdi Kanoun John Varzgar Dr Sanatan Chattopadhyay Dr Sarah Olsen et al. | Impact of Ge content on the gate oxide reliability of strained-Si/SiGe MOS devices | 2006 |
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Dr Suresh Uppal Dr Mehdi Kanoun John Varzgar Dr Sanatan Chattopadhyay Dr Sarah Olsen et al. | Impact of Ge content on the gate oxide reliability of strained-Si/SiGe MOS devices | 2006 |
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Goutan Dalapati Dr Kelvin Kwa Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al. | Impact of strained Si thickness and Ge our diffusion on strained-Si/SiO2 interface quality for surface channel strained Si n-MOSFET devices | 2006 |
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Goutan Dalapati Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen Dr Yuk Tsang et al. | Impact of strained-Si thickness and Ge out-diffusion on gate oxide quality for strained-Si surface channel n-MOSFETs | 2006 |
|
Dr Nebojsa Jankovic Professor Professor Anthony O'Neill
| Modelling of strained-Si/SiGe NMOS transistors including DC self-heating | 2006 |
|
Rimoon Agaiby Professor Anthony O'Neill Dr Sarah Olsen
| Quantifying Self-Heating Effects in Strained Si MOSFETs with Scaling | 2006 |
|
Rimoon Agaiby Professor Anthony O'Neill Dr Sarah Olsen
| Quantifying self-heating effects in strained Si MOSFETs with scaling | 2006 |
|
Arup Saha Dr Alton Horsfall Dr Sanatan Chattopadhyay Professor Nick Wright Professor Anthony O'Neill et al. | Quantum-mechanical modeling of current-voltage characteristics of Ti-silicided Schottky diodes | 2006 |
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John Varzgar Dr Mehdi Kanoun Dr Suresh Uppal Dr Sanatan Chattopadhyay Dr Yuk Tsang et al. | Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures | 2006 |
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John Varzgar Dr Mehdi Kanoun Dr Suresh Uppal Dr Sanatan Chattopadhyay Dr Yuk Tsang et al. | Reliability study of ultra-thin gate oxides on strained-Si/SiGe MOS structures | 2006 |
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Dr Sarah Olsen Dr Piotr Dobrosz Dr Enrique Escobedo-Cousin Rouzet Agaiby Rimoon Agaiby et al. | Strain characterisation in advanced Si devices | 2006 |
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Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rimoon Agaiby et al. | Strained Si MOSFETs using thin virtual substrates | 2006 |
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Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rimoon Agaiby et al. | Strained Si technology | 2006 |
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Professor Anthony O'Neill Dr Sarah Olsen Dr Sanatan Chattopadhyay
| Strained Si/SiGe MOS technology | 2006 |
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Professor Anthony O'Neill
| Strained Si: Materials, Devices and Processing | 2006 |
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Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rouzet Agaiby et al. | Strained silicon technology | 2006 |
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Irina Nikitina Dr Konstantin Vasilevskiy Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al. | Structural pattern formation in titanium-nickel contacts on silicon carbide following high-temperature annealing | 2006 |
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Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Steve Bull Professor Anthony O'Neill
| Structuralstability of strained Si layers on thin strain-relaxed buffers for high performance MOSFETs | 2006 |
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Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Steve Bull Professor Anthony O'Neill
| Study of surface roughness and dislocation generation in strained Si layers grown on thin strain-relaxed buffers for high performance MOSFETs | 2006 |
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Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill
| The relationship between strain generation and relaxation, composition and electrical performance in strained Si/SiGe MOS technology | 2006 |
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Goutan Dalapati Dr Kelvin Kwa Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al. | Thermal oxidation of strained-Si: impact of strained-Si thickness and Ge on Si/SiO2 interface | 2006 |
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Dr Sarah Olsen Professor Steve Bull Dr Piotr Dobrosz Dr Enrique Escobedo-Cousin Rouzet Agaiby et al. | Thermal stability of thin virtual substrates for high performance devices | 2006 |
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Dr Sarah Olsen Professor Anthony O'Neill
| A study of SiGe/Si n-MOSFET processed and unprocessed channel layers using FIB and TEM methods | 2005 |
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Professor Anthony O'Neill Dr Sarah Olsen
| Advancing strained silicon | 2005 |
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Professor Steve Bull Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill
| Assessment of strained silicon/SiGe with different architectures by Raman spectroscopy | 2005 |
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Kai Wang Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill Sorin Soare et al. | Calibration of MEMS-based test structures for predicting thermomechanical stress in integrated circuit interconnect structures | 2005 |
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Rimoon Agaiby Professor Anthony O'Neill Dr Sarah Olsen
| Design considerations for strained Si/SiGe deep submicron dual-channel CMOS using high thermal budgets | 2005 |
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Dr Sanatan Chattopadhyay Professor Alex Yakovlev Emeritus Professor Satnam Dlay Professor Anthony O'Neill
| Design ofsrained silicon inverters for fture VLSI applications | 2005 |
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Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al. | Doubling speed using strained Si/SiGe CMOS technology | 2005 |
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Praneet Bhatnagar Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill Dr Konstantin Vasilevskiy et al. | Effective edge termination design in SiCVJFET | 2005 |
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Irina Nikitina Dr Konstantin Vasilevskiy Professor Nick Wright Dr Alton Horsfall Professor Anthony O'Neill et al. | Formation and role of graphite and nickel silicide in nickel based ohmic contacts to n -type silicon carbide | 2005 |
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Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Goutan Dalapati et al. | Fowler-Nordheim tunnelling in strained Si/SiGe MOS devices: impact of cross-hatching and nanoscale roughness | 2005 |
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Dr Sarah Olsen Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al. | High performance strained Si.SiGe n-channel MOSFETs: impact of alloy composition and layer architecture | 2005 |
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Dr Sarah Olsen Dr Piotr Dobrosz Dr Enrique Escobedo-Cousin Professor Steve Bull Professor Anthony O'Neill et al. | Mobility-limiting mechanisms in single and dual channel strained Si/SiGe MOSFETs | 2005 |
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Rudra Dhar Goutan Dalapati Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen et al. | Modelling of self-heating in strained Si n-channel MOSFETs on SiGe virtual substrates | 2005 |
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Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al. | Obtaining mechanical parameters for metallisation stress sensor design using nanoindentation | 2005 |
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Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al. | Obtaining mechanical parameters for metallisation stress sensor design using nanoindentation | 2005 |
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Professor Steve Bull Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill
| On the relationship between electrical performance and Raman spectroscopic results for strained Si/SiGe devices | 2005 |
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Praneet Bhatnagar Dr Alton Horsfall Professor Nick Wright Dr Christopher Johnson Dr Konstantin Vasilevskiy et al. | Optimisation of a 4H-SiC enhancement mode power JFET for high temperature operation | 2005 |
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Chia-Ching Chen Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill
| Optimisation of heterostructure bipolar transistors in SiC | 2005 |
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Chia-Ching Chen Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill
| Optimisation of Heterostructure Bipolar Transistors in SiC | 2005 |
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Arup Saha Dr Alton Horsfall Dr Sanatan Chattopadhyay Professor Nick Wright Professor Anthony O'Neill et al. | Prediction of barrier inhomogeneities and carrier transport in Ni-silicided Schottky diode | 2005 |
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Dr Konstantin Vasilevskiy Professor Nick Wright Irina Nikitina Dr Alton Horsfall Professor Anthony O'Neill et al. | Protection of selectively implanted and patterned silicon carbide surfaces with graphite capping layer during post-implantation annealing | 2005 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Quantitative analysis of gate-oxide interface roughening in SiGe/Si virtual substrate-based transistor device structures | 2005 |
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Cezar Blasciuc-Dimitriu Dr Alton Horsfall Professor Nick Wright Dr Christopher Johnson Dr Konstantin Vasilevskiy et al. | Quantum modelling of I-V characteristics for 4H-SiC Schottky barrier diodes | 2005 |
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Dr Alton Horsfall Professor Nick Wright Sorin Soare Professor Steve Bull Professor Anthony O'Neill et al. | Sensitivity of a rotating beam sensor for stress evaluation in aluminium thin films | 2005 |
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Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa Dr Jie Zhang et al. | Strained Si/SiGe CMOS: high performance without re-tooling | 2005 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Strained-Si NMOSFETs on thin 200 nm virtual substrates | 2005 |
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Dr Sarah Olsen Professor Anthony O'Neill Dr Piotr Dobrosz Professor Steve Bull Luke Driscoll et al. | Study of strain relaxation in Si/SiGe metal-oxide-semiconductor field-effect transistors | 2005 |
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Dr Alton Horsfall Sorin Soare Professor Nick Wright Professor Anthony O'Neill Professor Steve Bull et al. | Test chip for the development and evaluation of sensors for measuring stress in metal interconnects | 2005 |
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Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill
| The use of Raman spectroscopy to identify strain and strain relaxation in strained Si/SiGe structures | 2005 |
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Dr Nebojsa Jankovic Professor Professor Anthony O'Neill
| 2D device-level simulation study of strained-Si pnp heterojunction bipolar transistors on virtual substrates | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill
| 3D determination of a MOSFET gate morphology by FIB tomography | 2004 |
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Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill Sorin Soare Professor Steve Bull et al. | Calibration and optimization of interconnect based MEMS test structures for predicting thermo-mechanical stress in metallization | 2004 |
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Dr Alton Horsfall Sorin Soare Professor Steve Bull Professor Nick Wright Professor Anthony O'Neill et al. | Dependence of process parameters on stress generation in aluminum thin films | 2004 |
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Dr Sarah Olsen Dr Kelvin Kwa Luke Driscoll Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al. | Design, fabrication and characterisation of strained Si/SiGe MOS transistors | 2004 |
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Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al. | Determination of mechanical parameters for rotating MEMS structures as a function of deposition method | 2004 |
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Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al. | Determination of mechanical parameters for rotating MEMS structures as a function of deposition method | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al. | Evaluation of strained Si/SiGe material for high performance CMOS | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al. | Evaluation of strained Si/SiGe material for high performance CMOS | 2004 |
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Dr Alton Horsfall Professor Nick Wright Dr Christopher Johnson Dr Konstantin Vasilevskiy Professor Anthony O'Neill et al. | First principles derivation of carrier transport across metal - SiC barriers | 2004 |
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Luke Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al. | Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters | 2004 |
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Lynn Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al. | Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters | 2004 |
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Luke Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al. | Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters | 2004 |
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Luke Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al. | Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Measurement of Relaxation in Strained Silicon by Grazing Incidence In-plane X-ray Diffraction | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Measurement of relaxation in strained silicon by grazing incidence in-plane x-ray diffraction | 2004 |
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Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill
| Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy | 2004 |
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Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill
| Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy | 2004 |
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Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill
| Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy | 2004 |
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Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill
| Measurement of the Residual Macro and Microstrain in Strained Si/SiGe using Raman Spectroscopy Z Metal | 2004 |
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Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill
| Measurement of the residual strain in strained Si/SiGe using Raman spectroscopy | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Measurements of gate-oxide interface roughness in strained-Si virtual substrate SiGe/Si MOSFET device structures | 2004 |
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Sorin Soare Professor Steve Bull Professor Anthony O'Neill Professor Nick Wright Dr Alton Horsfall et al. | Nanoindentation assessment of aluminium metallisation; the effect of creep and pile-up | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill Luke Driscoll Dr Sanatan Chattopadhyay Dr Kelvin Kwa et al. | Optimization of alloy composition for high-performance strained-Si-SiGe N-channel MOSFETs | 2004 |
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Dr Nebojsa Jankovic Professor Professor Anthony O'Neill
| Performance evaluation of SiGe heterojunction bipolar transistors on virtual substrates | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill Dr Jun Zhang
| Si-Based Heterojunctions and Strained Si: Growth, Characterization and Applications | 2004 |
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Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen Professor Anthony O'Neill
| Strained Si MOSFETs on relaxed SiGe platforms: Performance and challenges | 2004 |
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Dr Sarah Olsen Dr Kelvin Kwa Dr Sanatan Chattopadhyay Luke Driscoll Professor Anthony O'Neill et al. | Strained Si/SiGe n-channel MISFETs | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Strained-Si n-MOS surface-channel and buried Si0.7Ge 0.3 compressively-strained p-MOS fabricated in a 0.25 μm heterostructure CMOS process | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Luke Driscoll Dr Kelvin Kwa et al. | Study of single- and dual-channel designs for high-performance strained-Si-SiGe n-MOSFETs | 2004 |
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Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill
| Technique for measuring the residual strain in strained Si/SiGe MOSFET structures using Raman spectroscopy | 2004 |
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Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill
| Technique for measuring the residual strain in strained Si/SiGe MOSFET structures using Raman spectroscopy | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Temperature dependence of submicrometer strained-Si surface channel n-type MOSFETs in DT mode | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Temperature sensitivity of DC operation of sub-micron strained-Si MOSFETs | 2004 |
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Dr Alton Horsfall Sorin Soare Professor Nick Wright Professor Anthony O'Neill Professor Steve Bull et al. | Test chip for the development and evaluation of test structures for measuring stress in metal interconnect | 2004 |
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Dr Sarah Olsen Professor Anthony O'Neill Professor Steve Bull Dr Sanatan Chattopadhyay Dr Kelvin Kwa et al. | Thermal oxidation of strained Si/SiGe: impact of surface morphology and effect on MOS devices | 2004 |
|
Dr Sarah Olsen Professor Anthony O'Neill
| 3D determination of a MOSFET gate morphology by FIB tomography | 2003 |
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Dr Kelvin Kwa Dr Sanatan Chattopadhyay Dr Nebojsa Jankovic Professor Dr Sarah Olsen Luke Driscoll et al. | A model for capacitance reconstruction from measured lossy MOS capacitance-voltage characteristics | 2003 |
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Dr Alton Horsfall Sorin Soare Professor Nick Wright Professor Anthony O'Neill Professor Steve Bull et al. | A novel sensor for the direct measurement of process induced residual stress in interconnects | 2003 |
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Sorin Soare Professor Steve Bull Dr Alton Horsfall Joana Santos Professor Anthony O'Neill et al. | Assessment of aluminium thin films by nanindentation | 2003 |
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Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al. | Capacitance - Voltage Characterization of Strained Si/SiGe Multiple Heterojunction Capacitors as a Tool for Heterojunction Metal Oxide Semiconductor Field Effect Transistor Channel Design | 2003 |
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Cezar Blasciuc-Dimitriu Dr Alton Horsfall Dr Konstantin Vasilevskiy Dr Christopher Johnson Professor Nick Wright et al. | Characterisation of the High Temperature Performance of 4H-SiC Schottky Barrier Diodes | 2003 |
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Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al. | C-V characterization of strained Si/SiGe multiple heterojunction capacitors as a tool for heterojunction MOSFET channel design | 2003 |
|
Professor Anthony O'Neill Dr Sarah Olsen
| Design, Fabrication and Characterisation of Strained Si/SiGe MOSFETs | 2003 |
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Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Nicola Wright et al. | Determination of mechanical parameters for rotatin MEMS as function of deposition method | 2003 |
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Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al. | Determination of mechanical parameters for rotating MEMS as a function of deposition method | 2003 |
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Sorin Soare Professor Steve Bull Dr Adrian Oila Professor Anthony O'Neill Professor Nick Wright et al. | Determination of mechanical parameters for rotating MEMS structures as a function of deposition method | 2003 |
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Dr Alton Horsfall Sorin Soare Professor Nick Wright Professor Anthony O'Neill Professor Steve Bull et al. | Direct measurement of residual stress in sub-micron interconnects | 2003 |
|
Dr Nebojsa Jankovic Professor Professor Anthony O'Neill
| Enhanced performance virtual substrate heterojunction bipolar transistor using strained-Si/SiGe emitter | 2003 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Gate-oxide interface roughness analyses for oxidation on strained and unstrained vicinal Si surfaces by transmission electron microscopy | 2003 |
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Dr Sarah Olsen Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al. | High performance strained Si.SiGe NMOSFETs using a novel CMOS architecture | 2003 |
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Dr Sarah Olsen Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al. | High performance strained Si/SiGe n-channel MOSFETs: impact of alloy composition and layer architecture | 2003 |
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Dr Sarah Olsen Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay Professor Anthony O'Neill et al. | High performance strained Si/SiGe nMOSFETs using a novel CMOS architecture | 2003 |
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Dr Sarah Olsen Professor Anthony O'Neill Luke Driscoll Dr Kelvin Kwa Dr Sanatan Chattopadhyay et al. | High-performance nMOSFETs using a novel strained Si/SiGe CMOS architecture | 2003 |
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Sorin Soare Dr Alton Horsfall Professor Steve Bull Professor Nick Wright Dr Adrian Oila et al. | Hinge optimisation in a micro-rotating structure for stress gauging in integrated circuit interconnects | 2003 |
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Sorin Soare Professor Steve Bull Dr Alton Horsfall Professor Nick Wright Professor Anthony O'Neill et al. | Hinge sensitivity in a micro-rotating structure for predicting induced thermo mechanical stress in integrated circuit metal interconnects | 2003 |
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Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al. | Impact of virtual substrate Ge composition on strained Si MOSFET performance | 2003 |
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Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll Professor Steve Bull et al. | Impact of Virtual Substrate Ge Composition on Strained Si MOSFET Performance | 2003 |
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Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Dr Kelvin Kwa Luke Driscoll et al. | Impact of virtual substrate growth on high performance strained Si/SiGe double quantum well metal-oxide-semiconductor field-effect transistors | 2003 |
|
Dr Sarah Olsen Professor Anthony O'Neill
| Impact of virtual substrate quality on performance enhancements in strained Si/SiGe heterojunction n-channel MOSFETs | 2003 |
|
Dr Sarah Olsen Professor Anthony O'Neill
| Impact of virtual substrate quality on performance enhancements in strained Si/SiGe heterojunction n-channel MOSFETs | 2003 |
|
Dr Sarah Olsen Professor Anthony O'Neill Dr Jie Zhang
| Measurements of gate-oxide interface roughness in strained-Si virtual substrate SiGe/Si MOSFET device structures | 2003 |
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Dr Sarah Olsen Professor Anthony O'Neill Dr Sanatan Chattopadhyay Luke Driscoll Dr Kelvin Kwa et al. | N-MOSFET performance in single and dual channel strained Si/SiGe CMOS architectures | 2003 |
|
Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill
| Optimisation of a 4H-SiC enhancement mode power JFET | 2003 |
|
Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill
| Optimisation of a 4H-SiC Enhancement Mode Power JFET | 2003 |
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Dr Kelvin Kwa Dr Sanatan Chattopadhyay Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al. | Optimisation of channel thickness in strained Si/SiGe MOSFETs | 2003 |
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Dr Kelvin Kwa Dr Sanatan Chattopadhyay Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al. | Optimisation of Channel Thickness in Strained Si/SiGe MOSFETs | 2003 |
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Dr Kelvin Kwa Dr Sanatan Chattopadhyay Dr Sarah Olsen Luke Driscoll Professor Anthony O'Neill et al. | Optimisation of channel thickness in strained Si/SiGe MOSFETs | 2003 |
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Dr Nebojsa Jankovic Professor Professor Anthony O'Neill
| Performance evaluation of SiGe HBTs on virtual substrates | 2003 |
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Professor Anthony O'Neill
| Propagation of x-rays in carbon nanotubes | 2003 |
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Professor Anthony O'Neill
| Propagation of X-rays in carbon nanotubes | 2003 |
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Professor Anthony O'Neill
| Propagation of x-rays in carbon nanotubes | 2003 |
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Dr Alton Horsfall Sorin Soare Dr Adrian Oila Professor Steve Bull Professor Nick Wright et al. | Residual Stress Sensor for the Microelectronics Industry | 2003 |
|
Professor Anthony O'Neill Dr Jun Zhang
| The relative performance enhancement of strained-Si and buried channel p-MOS as a function of lithographic and effective gate lengths | 2003 |
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Dr Konstantin Vasilevskiy Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al. | 4H-SiC rectifiers with dual metal planar Schottky contacts | 2002 |
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Dr Konstantin Vasilevskiy Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al. | 4H-SiC Schottky diodes with high on/off current ratio | 2002 |
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Dr Konstantin Vasilevskiy Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al. | 4H-SiC Schottky diodes with high on/off current ratio | 2002 |
|
Sorin Soare Professor Steve Bull Professor Anthony O'Neill Professor Nick Wright
| Assessment of aluminium metallisation by nanoindentation | 2002 |
|
Cezar Blasciuc-Dimitriu Dr Alton Horsfall Dr Konstantin Vasilevskiy Dr Christopher Johnson Professor Nick Wright et al. | Characterisation of the high temperature performance of 4H-SiC Schottky barrier diodes | 2002 |
|
Stephen Badcock Professor Anthony O'Neill Dr Graeme Chester
| Device and circuit performance of SiGe/Si MOSFETs | 2002 |
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Stephen Badcock Professor Anthony O'Neill Dr Graeme Chester
| Device and Circuit Performance of SiGe/Si MOSFETs | 2002 |
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Dr Sarah Olsen Professor Anthony O'Neill Professor Steve Bull
| Effect of metal-oxide-semiconductor processing on the surface rouhness of strained Si/SiGe material | 2002 |
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Dr Gordon Phelps Professor Nick Wright Dr Graeme Chester Dr Christopher Johnson Professor Anthony O'Neill et al. | Enhanced dopant diffusion effects in 4H silicon carbide | 2002 |
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Dr Gordon Phelps Professor Nick Wright Dr Graeme Chester Dr Christopher Johnson Professor Anthony O'Neill et al. | Enhanced nitrogen diffusion in 4H-SiC | 2002 |
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Dr Gordon Phelps Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Sylvie Ortolland et al. | Enhanced nitrogen diffusion in 4H-SiC | 2002 |
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Dr Sarah Olsen Professor Anthony O'Neill
| Measurement of the nanoscale roughness of advanced MOSFET layer structures | 2002 |
|
Dr Sarah Olsen Professor Anthony O'Neill
| Measurement of the nanoscale roughness of advanced MOSFET layer structures | 2002 |
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Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill
| Optimisation of a 4H-SiC enhancement mode power JFET | 2002 |
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Dr Alton Horsfall Dr Konstantin Vasilevskiy Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al. | Optimisation of implanted guard-ring terminations in 4H-SiC Schottky diodes | 2002 |
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Dr Alton Horsfall Dr Konstantin Vasilevskiy Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill et al. | Optimisation of implanted guard-ring terminations in 4H-SiC Schottky diodes | 2002 |
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Dr Gordon Phelps Professor Nick Wright Dr Graeme Chester Dr Christopher Johnson Professor Anthony O'Neill et al. | Step bunching fabrication constraints in silicon carbide | 2002 |
|
Dr Sarah Olsen Professor Anthony O'Neill
| Strained Si/SiGe n-channel MOSFETs: Impact of cross-hatching on device performance | 2002 |
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Dr Alton Horsfall Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill
| 4H-SiC Schottky diodes with high on-off current ratio | 2001 |
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Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland et al. | Physical characterization of residual implant damage in 4H-SiC double implanted bipolar technology | 2001 |
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Dr Christopher Johnson Professor Nick Wright Dominique Morrison Dr Alton Horsfall Dr Sylvie Ortolland et al. | Recent progress and current issues in SiC semiconductor devices for power applications | 2001 |
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Stephen Badcock Professor Anthony O'Neill
| SiGe HMOSFET differential pair | 2001 |
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Dominique Morrison Professor Nick Wright Dr Alton Horsfall Dr Christopher Johnson Professor Anthony O'Neill et al. | Effect of post-implantation anneal on the electrical characteristics of Ni 4H-SiC Schottky barrier diodes terminated using self-aligned argon ion implantation | 2000 |
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Dr Mohamad Hossin Professor Nick Wright Professor Anthony O'Neill
| Evaluation of GaAs Schottky gate bipolar transistor (SGBT) by electrothermal simulation | 2000 |
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Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland et al. | Implanted bipolar technology in 4H-SiC | 2000 |
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Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland et al. | Implanted bipolar technology in 4H-SiC | 2000 |
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Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Kazuhiro Adachi et al. | Implanted bipolar technology in 4H-SiC | 2000 |
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Dominique Morrison Professor Nick Wright Dr Sylvie Ortolland Dr Christopher Johnson Professor Anthony O'Neill et al. | Low temperature annealing of 4H-SiC Schottky diode edge terminations 4 formed by 30 keV Ar+ implantation | 2000 |
|
Stephen Badcock Professor Anthony O'Neill
| Material requirements and design considerations for Si/SiGe heterojunction CMOS | 2000 |
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Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland et al. | Physical characterization of residual implant damage in 4H-SiC double implanted bipolar technology | 2000 |
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Dr Christopher Johnson Professor Anthony O'Neill Dr Alton Horsfall Dr Sylvie Ortolland Kazuhiro Adachi et al. | Physical characterization of residual implant damage in 4H-SiC double implanted bipolar technology | 2000 |
|
Dominique Morrison Dr Christopher Johnson Professor Nick Wright Professor Anthony O'Neill
| Surface preparation for Schottky metal - 4H-SiC contacts formed on plasma-etched SiC | 2000 |
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Kazuhiro Adachi Dr Christopher Johnson Dr Sylvie Ortolland Professor Anthony O'Neill
| TCAD evaluation of double implanted 4H-SiC power bipolar transistors | 2000 |
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Dominique Morrison Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill
| Anomalous forward I-V characteristics of Ti/Au SiC Schottky barrier diodes | 1999 |
|
Dominique Morrison Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill
| Anomalous forward I-V characteristics of Ti/Au SiC Schottky barrier diodes | 1999 |
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Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill
| Cell geometry optimisation of 4H-SiC power UMOSFETs by electrothermal simulation | 1999 |
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Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill
| Cell geometry optimisation of 4H-SiC UMOSFETs by electrothernal simulation | 1999 |
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Professor Anthony O'Neill
| Electromigration testing of via terminated test structures | 1999 |
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Professor Anthony O'Neill Dr Christopher Johnson
| Evaluation of 4H-SiC varactor diodes for microwave applications | 1999 |
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Dr Christopher Johnson Professor Anthony O'Neill
| Mechanistic model for oxidation of SiC | 1999 |
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Dr Sylvie Ortolland Dr Christopher Johnson Professor Nick Wright Dominique Morrison Professor Anthony O'Neill et al. | Optimisation of a power 4H-SiC SIT device for RF heating applications | 1999 |
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Dr Sylvie Ortolland Dr Christopher Johnson Dominique Morrison Professor Anthony O'Neill
| Optimisation of a power 4H-SiC SIT device for RF heating applications | 1999 |
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Dr Christopher Johnson Professor Anthony O'Neill
| Oxidation modelling for SiC | 1999 |
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Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill
| Oxidation modelling for SiC | 1999 |
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Professor Anthony O'Neill
| Reliability studies of Cu using wafer level joule heated electromigration test | 1999 |
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Professor Anthony O'Neill
| SiGe virtual substrate N-channel heterojunction MOSFETs | 1999 |
|
Kazuhiro Adachi Dr Christopher Johnson Dr Sylvie Ortolland Professor Nick Wright Professor Anthony O'Neill et al. | TCAD evaluation of double implanted 4H-SiC power bipolar transistors | 1999 |
|
Dominique Morrison Dr Christopher Johnson Professor Anthony O'Neill Dr Sylvie Ortolland
| The effect of annealing on argon implanted edge terminations for 4H-SiC Schottky diodes | 1999 |
|
Professor Nick Wright Dr Christopher Johnson Professor Anthony O'Neill
| Sulphur based surface passivation for high voltage GaAS Schottky diodes | 1998 |
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Professor Steve Bull Professor Anthony O'Neill
| Simple computer modeling of the grain microstructure of Al-4wt%Cu interconnection lines | 1997 |
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