Toggle Main Menu Toggle Search

Open Access padlockePrints

Measurement of relaxation in strained silicon by grazing incidence in-plane x-ray diffraction

Lookup NU author(s): Dr Sarah Olsen, Professor Anthony O'Neill


Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Lafford TA, Olsen SH, O'Neill AG, Tanner BK

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: High Resolution X-Ray Diffraction and Imaging (XTOP)

Year of Conference: 2004