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Measurement of relaxation in strained silicon by grazing incidence in-plane x-ray diffraction

Lookup NU author(s): Dr Sarah Olsen, Professor Anthony O'Neill

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Publication metadata

Author(s): Lafford TA, Olsen SH, O'Neill AG, Tanner BK

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: High Resolution X-Ray Diffraction and Imaging (XTOP)

Year of Conference: 2004

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