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Quantifying self-heating effects in strained Si MOSFETs with scaling

Lookup NU author(s): Rimoon Agaiby, Professor Anthony O'Neill, Dr Sarah Olsen

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Author(s): Agaiby R, O'Neill AG, Olsen SH, Eneman G, Verheyen P, Loo R, Claeys C

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: European Solid State Device Research Conference (ESSDERC)

Year of Conference: 2006

Pages: 97-100

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