Quantifying Self-Heating Effects in Strained Si MOSFETs with Scaling

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Author(s): Agaiby R, O'Neill AG, Olsen SH, Eneman G, Verheyen P, Loo R, Claeys C

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Proceeding of the 36th European Solid-State Device Research Conference (ESSDERC)

Year of Conference: 2006

Pages: 97-100

ISSN: 1930-8876

Publisher: IEEE

URL: http://dx.doi.org/10.1109/ESSDER.2006.307647

DOI: 10.1109/ESSDER.2006.307647

Library holdings: Search Newcastle University Library for this item

ISBN: 1424403014

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