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Characteristics of thermally oxidized-Ti as a high-k gate dielectric on SiC metal-oxide-semiconductor devices

Lookup NU author(s): Nipapan Poolamai, Dr Rajat Mahapatra, Professor Nick Wright

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Publication metadata

Author(s): Poolamai N, Mahapatra R, Wright NG, Coleman PG, Burrows CP

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Meeting Abstracts: 208th Meeting of The Electrochemical Society

Year of Conference: 2005

Pages: 967

ISSN: 1091-8213

Publisher: Electrochemical Society, Inc.

Library holdings: Search Newcastle University Library for this item

ISBN: 21512035

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