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Browsing publications by Dr Rajat Mahapatra

Newcastle AuthorsTitleYearFull text
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Forming-Free Reversible Bipolar Resistive Switching Behavior in Al-Doped HfO2 Metal-Insulator-Metal Devices2012
Chris Spargo
Benjamin Furnival
Dr Rajat Mahapatra
Professor Jon Goss
Professor Nick Wright
et al.		Identification of Slow States at the SiO2/SiC Interface Through Sub-Bandgap Illumination2012
Dr Rajat Mahapatra
Benjamin Furnival
Professor Nick Wright
Dr Alton Horsfall
Study of the Interface Properties of TiO2/SiO2/SiC by Photocapacitance2011
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Interface and carrier transport behaviour in Al/HfO2/SiO 2/SiC Structure2009
Ming-Hung Weng
Dr Rajat Mahapatra
Professor Nick Wright
Dr Alton Horsfall
Post metallization annealing characterization of interface properties of high-K dielectrics stack on silicon carbide2009
Bing Miao
Dr Rajat Mahapatra
Professor Nick Wright
Dr Alton Horsfall
Radiation Induced Change in Defect Density in HfO2-Based MIM Capacitors2009
Bing Miao
Dr Rajat Mahapatra
Dr Alton Horsfall
Electrical properties of thermally grown HfO2 and HfO 2/TiO2/HfO2 MIM capacitors fabricated on SiO2/Si substrate and HfO2 MIM capacitors fabricated on sapphire2008
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Energy-band alignment of HfO2/SiO2/SiC gate dielectric stack2008
Dr Ming-Hung Weng
Dr Rajat Mahapatra
Professor Nick Wright
Dr Alton Horsfall
Role of oxygen in high temperature hydrogen sulfide detection using MISiC sensors2008
Bing Miao
Dr Rajat Mahapatra
Professor Nick Wright
Dr Alton Horsfall
The role of carbon contamination in voltage linearity and leakage current in high-k metal-insulator-metal capacitors2008
Dr Rajat Mahapatra
Dr Alton Horsfall
Dr Sanatan Chattopadhyay
Professor Nick Wright
Effects of interface engineering for HfO2 gate dielectric stack on 4H-SiC2007
Dr Ming-Hung Weng
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Hydrogen sulphide detection in extreme environments2007
Dr Rajat Mahapatra
Peter Tappin
Bing Miao
Dr Alton Horsfall
Dr Sanatan Chattopadhyay
et al.		Impact of interfacial nitridation of HfO2 high-k gate dielectric stack on 4H-SiC2007
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Interface and Carrier Transport Behaviour in Al/HfO2/SiO2/SiC Structure2007
Dr Rajat Mahapatra
Nipapan Poolamai
Dr Alton Horsfall
Dr Sanatan Chattopadhyay
Professor Nick Wright
Leakage current and charge trapping behavior in Ti O2 Si O2 high- κ gate dielectric stack on 4H-SiC substrate2007
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