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Browsing publications by Dr Rajat Mahapatra.

Newcastle AuthorsTitleYearFull text
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Forming-Free Reversible Bipolar Resistive Switching Behavior in Al-Doped HfO2 Metal-Insulator-Metal Devices2012
Chris Spargo
Benjamin Furnival
Dr Rajat Mahapatra
Professor Jon Goss
Professor Nick Wright
et al.
Identification of Slow States at the SiO2/SiC Interface Through Sub-Bandgap Illumination2012
Dr Rajat Mahapatra
Benjamin Furnival
Professor Nick Wright
Dr Alton Horsfall
Study of the Interface Properties of TiO2/SiO2/SiC by Photocapacitance2011
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Interface and carrier transport behaviour in Al/HfO2/SiO 2/SiC Structure2009
Ming-Hung Weng
Dr Rajat Mahapatra
Professor Nick Wright
Dr Alton Horsfall
Post metallization annealing characterization of interface properties of high-K dielectrics stack on silicon carbide2009
Bing Miao
Dr Rajat Mahapatra
Professor Nick Wright
Dr Alton Horsfall
Radiation Induced Change in Defect Density in HfO2-Based MIM Capacitors2009
Bing Miao
Dr Rajat Mahapatra
Dr Alton Horsfall
Electrical properties of thermally grown HfO2 and HfO 2/TiO2/HfO2 MIM capacitors fabricated on SiO2/Si substrate and HfO2 MIM capacitors fabricated on sapphire2008
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Energy-band alignment of HfO2/SiO2/SiC gate dielectric stack2008
Dr Ming-Hung Weng
Dr Rajat Mahapatra
Professor Nick Wright
Dr Alton Horsfall
Role of oxygen in high temperature hydrogen sulfide detection using MISiC sensors2008
Bing Miao
Dr Rajat Mahapatra
Professor Nick Wright
Dr Alton Horsfall
The role of carbon contamination in voltage linearity and leakage current in high-k metal-insulator-metal capacitors2008
Dr Rajat Mahapatra
Dr Alton Horsfall
Dr Sanatan Chattopadhyay
Professor Nick Wright
Effects of interface engineering for HfO2 gate dielectric stack on 4H-SiC2007
Dr Ming-Hung Weng
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Hydrogen sulphide detection in extreme environments2007
Dr Rajat Mahapatra
Peter Tappin
Bing Miao
Dr Alton Horsfall
Dr Sanatan Chattopadhyay
et al.
Impact of interfacial nitridation of HfO2 high-k gate dielectric stack on 4H-SiC2007
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Interface and Carrier Transport Behaviour in Al/HfO2/SiO2/SiC Structure2007
Dr Rajat Mahapatra
Nipapan Poolamai
Dr Alton Horsfall
Dr Sanatan Chattopadhyay
Professor Nick Wright
et al.
Leakage current and charge trapping behavior in Ti O2 Si O2 high- κ gate dielectric stack on 4H-SiC substrate2007
Dr Rajat Mahapatra
Professor Nick Wright
Positron spectroscopy of high-k dielectric films on SiC2007
Dr Ming-Hung Weng
Dr Rajat Mahapatra
Professor Nick Wright
Dr Alton Horsfall
Post Metallization Annealing Characterization of Interface Properties of High-kappa Dielectrics Stack on Silicon Carbide2007
Peter Tappin
Dr Rajat Mahapatra
Professor Nick Wright
Praneet Bhatnagar
Dr Alton Horsfall
et al.
Simulation study of high-k materials for SiC trench MOSFETs2007
Dr Ming-Hung Weng
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Trap assisted conduction in high k dielectric capacitors on 4H-SiC2007
Dr Alton Horsfall
Dr Ming-Hung Weng
Dr Rajat Mahapatra
Professor Nick Wright
Trap assisted gas sensing mechanism in MISiC capacitors2007
Dr Ming-Hung Weng
Dr Rajat Mahapatra
Dr Alton Horsfall
Professor Nick Wright
Trap-assisted gas sensing mechanism in Pd/TiO2/SiO 2/SiC capacitors at high temperatures2007
Dr Rajat Mahapatra
Professor Nick Wright
Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks2007
Dr Rajat Mahapatra
Characteristics of ZrO2 gate dielectrics on O2- and N2O-plasma treated partially strain-compensated Si 0.69Ge0.3C0.01 layers2006
Dr Rajat Mahapatra
Nipapan Poolamai
Dr Sanatan Chattopadhyay
Professor Nick Wright
Characterization of thermally oxidized Ti/SiO2 gate dielectric stacks on 4H-SiC substrate2006
Dr Rajat Mahapatra
Electrical properties of ultrathin HfO2 gate dielectrics on partially strain compensated SiGeC/Si heterostructures2006
Dr Ming-Hung Weng
Dr Alton Horsfall
Dr Rajat Mahapatra
First observation of hydrogen sensing by trap assisted conduction current in Pd/TiO2/SiC capacitors at high temperature2006
Dr Ming-Hung Weng
Dr Rajat Mahapatra
Peter Tappin
Bing Miao
Dr Sanatan Chattopadhyay
et al.
High temperature characterization of high-κ dielectrics on SiC2006
Dr Rajat Mahapatra
High-k gate oxide for silicon heterostructure MOSFET devices2006
Nipapan Poolamai
Dr Rajat Mahapatra
Professor Nick Wright
Characteristics of thermally oxidized-Ti as a high-k gate dielectric on SiC metal-oxide-semiconductor devices2005
Dr Rajat Mahapatra
Nipapan Poolamai
Professor Nick Wright
Characteristics of thermally oxidized-Ti as a high-k gate dielectric on SiC metal-oxide-semiconductor devices2005
Dr Rajat Mahapatra
Professor Nick Wright
Characteristics of Thermally Oxidized-Ti as a High-k Gate Dielectric on SiC Metal-Oxide-Semiconductor Devices2005
Dr Rajat Mahapatra
Effects of interfacial NH3/N2O-plasma treatment on the structural and electrical properties of ultra-thin HfO2 gate dielectrics on p-Si substrates2005
Dr Rajat Mahapatra
Properties of ultrathin oxynitride films grown on Si0.74Ge0.26/Si heterolayers using low energy plasma source nitrogen implantation2005
Dr Rajat Mahapatra
Charge Storage and Photoluminescence Characteristics of Silicon Oxide Embedded Ge Nanocrystal Trilayer Structures2004
Dr Rajat Mahapatra
Physical and electrical properties of ultrathin HfO2/HfSixOy stacked gate dielectrics on compressively strained-Si0.74Ge0.26/Si heterolayers2004
Dr Rajat Mahapatra
Temperature dependent electrical properties of plasma grown gate oxides on tensile strained Si0.993C0.007 layers2004
Dr Rajat Mahapatra
Ultrathin HfO2 gate dielectrics on partially strain compensated SiGeC/Si heterostructure2004
Dr Rajat Mahapatra
Characteristics of ultrathin HfO2 gate dielectrics on strained-Si0.74Ge0.26 layers2003
Dr Rajat Mahapatra
Effects of interfacial nitrogen on the structural and electrical properties of ultrathin ZrO2 gate dielectrics on partially-strain- compensated SiGeC/Si heterolayers2003
Dr Rajat Mahapatra
Electrical and interfacial characteristics of ultrathin ZrO2 gate dielectrics on strain compensated SiGeC/Si heterostructure2003
Dr Rajat Mahapatra
Microwave plasma oxidation of gallium nitride2003
Dr Rajat Mahapatra
Structural and electrical characteristics of the interfacial layer of ultrathin ZrO2 films on partially strain compensated Si0.69Ge0.3C0.01 layers2003
Dr Rajat Mahapatra
Electrical properties of plasma grown gate oxides on tensile strained Si1-yCy alloy2002