Dr Rajat Mahapatra Dr Alton Horsfall Professor Nick Wright
| Forming-Free Reversible Bipolar Resistive Switching Behavior in Al-Doped HfO2 Metal-Insulator-Metal Devices | 2012 |
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Chris Spargo Benjamin Furnival Dr Rajat Mahapatra Professor Jon Goss Professor Nick Wright et al. | Identification of Slow States at the SiO2/SiC Interface Through Sub-Bandgap Illumination | 2012 |
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Dr Rajat Mahapatra Benjamin Furnival Professor Nick Wright Dr Alton Horsfall
| Study of the Interface Properties of TiO2/SiO2/SiC by Photocapacitance | 2011 |
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Dr Rajat Mahapatra Dr Alton Horsfall Professor Nick Wright
| Interface and carrier transport behaviour in Al/HfO2/SiO 2/SiC Structure | 2009 |
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Ming-Hung Weng Dr Rajat Mahapatra Professor Nick Wright Dr Alton Horsfall
| Post metallization annealing characterization of interface properties of high-K dielectrics stack on silicon carbide | 2009 |
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Bing Miao Dr Rajat Mahapatra Professor Nick Wright Dr Alton Horsfall
| Radiation Induced Change in Defect Density in HfO2-Based MIM Capacitors | 2009 |
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Bing Miao Dr Rajat Mahapatra Dr Alton Horsfall
| Electrical properties of thermally grown HfO2 and HfO 2/TiO2/HfO2 MIM capacitors fabricated on SiO2/Si substrate and HfO2 MIM capacitors fabricated on sapphire | 2008 |
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Dr Rajat Mahapatra Dr Alton Horsfall Professor Nick Wright
| Energy-band alignment of HfO2/SiO2/SiC gate dielectric stack | 2008 |
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Dr Ming-Hung Weng Dr Rajat Mahapatra Professor Nick Wright Dr Alton Horsfall
| Role of oxygen in high temperature hydrogen sulfide detection using MISiC sensors | 2008 |
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Bing Miao Dr Rajat Mahapatra Professor Nick Wright Dr Alton Horsfall
| The role of carbon contamination in voltage linearity and leakage current in high-k metal-insulator-metal capacitors | 2008 |
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Dr Rajat Mahapatra Dr Alton Horsfall Dr Sanatan Chattopadhyay Professor Nick Wright
| Effects of interface engineering for HfO2 gate dielectric stack on 4H-SiC | 2007 |
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Dr Ming-Hung Weng Dr Rajat Mahapatra Dr Alton Horsfall Professor Nick Wright
| Hydrogen sulphide detection in extreme environments | 2007 |
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Dr Rajat Mahapatra Peter Tappin Bing Miao Dr Alton Horsfall Dr Sanatan Chattopadhyay et al. | Impact of interfacial nitridation of HfO2 high-k gate dielectric stack on 4H-SiC | 2007 |
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Dr Rajat Mahapatra Dr Alton Horsfall Professor Nick Wright
| Interface and Carrier Transport Behaviour in Al/HfO2/SiO2/SiC Structure | 2007 |
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Dr Rajat Mahapatra Nipapan Poolamai Dr Alton Horsfall Dr Sanatan Chattopadhyay Professor Nick Wright et al. | Leakage current and charge trapping behavior in Ti O2 Si O2 high- κ gate dielectric stack on 4H-SiC substrate | 2007 |
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Dr Rajat Mahapatra Professor Nick Wright
| Positron spectroscopy of high-k dielectric films on SiC | 2007 |
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Dr Ming-Hung Weng Dr Rajat Mahapatra Professor Nick Wright Dr Alton Horsfall
| Post Metallization Annealing Characterization of Interface Properties of High-kappa Dielectrics Stack on Silicon Carbide | 2007 |
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Peter Tappin Dr Rajat Mahapatra Professor Nick Wright Praneet Bhatnagar Dr Alton Horsfall et al. | Simulation study of high-k materials for SiC trench MOSFETs | 2007 |
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Dr Ming-Hung Weng Dr Rajat Mahapatra Dr Alton Horsfall Professor Nick Wright
| Trap assisted conduction in high k dielectric capacitors on 4H-SiC | 2007 |
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Dr Alton Horsfall Dr Ming-Hung Weng Dr Rajat Mahapatra Professor Nick Wright
| Trap assisted gas sensing mechanism in MISiC capacitors | 2007 |
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Dr Ming-Hung Weng Dr Rajat Mahapatra Dr Alton Horsfall Professor Nick Wright
| Trap-assisted gas sensing mechanism in Pd/TiO2/SiO 2/SiC capacitors at high temperatures | 2007 |
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Dr Rajat Mahapatra Professor Nick Wright
| Vacancy-type defects in TiO2/SiO2/SiC dielectric stacks | 2007 |
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Dr Rajat Mahapatra
| Characteristics of ZrO2 gate dielectrics on O2- and N2O-plasma treated partially strain-compensated Si 0.69Ge0.3C0.01 layers | 2006 |
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Dr Rajat Mahapatra Nipapan Poolamai Dr Sanatan Chattopadhyay Professor Nick Wright
| Characterization of thermally oxidized Ti/SiO2 gate dielectric stacks on 4H-SiC substrate | 2006 |
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Dr Rajat Mahapatra
| Electrical properties of ultrathin HfO2 gate dielectrics on partially strain compensated SiGeC/Si heterostructures | 2006 |
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Dr Ming-Hung Weng Dr Alton Horsfall Dr Rajat Mahapatra
| First observation of hydrogen sensing by trap assisted conduction current in Pd/TiO2/SiC capacitors at high temperature | 2006 |
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Dr Ming-Hung Weng Dr Rajat Mahapatra Peter Tappin Bing Miao Dr Sanatan Chattopadhyay et al. | High temperature characterization of high-κ dielectrics on SiC | 2006 |
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Dr Rajat Mahapatra
| High-k gate oxide for silicon heterostructure MOSFET devices | 2006 |
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Nipapan Poolamai Dr Rajat Mahapatra Professor Nick Wright
| Characteristics of thermally oxidized-Ti as a high-k gate dielectric on SiC metal-oxide-semiconductor devices | 2005 |
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Dr Rajat Mahapatra Nipapan Poolamai Professor Nick Wright
| Characteristics of thermally oxidized-Ti as a high-k gate dielectric on SiC metal-oxide-semiconductor devices | 2005 |
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Dr Rajat Mahapatra Professor Nick Wright
| Characteristics of Thermally Oxidized-Ti as a High-k Gate Dielectric on SiC Metal-Oxide-Semiconductor Devices | 2005 |
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Dr Rajat Mahapatra
| Effects of interfacial NH3/N2O-plasma treatment on the structural and electrical properties of ultra-thin HfO2 gate dielectrics on p-Si substrates | 2005 |
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Dr Rajat Mahapatra
| Properties of ultrathin oxynitride films grown on Si0.74Ge0.26/Si heterolayers using low energy plasma source nitrogen implantation | 2005 |
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Dr Rajat Mahapatra
| Charge Storage and Photoluminescence Characteristics of Silicon Oxide Embedded Ge Nanocrystal Trilayer Structures | 2004 |
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Dr Rajat Mahapatra
| Physical and electrical properties of ultrathin HfO2/HfSixOy stacked gate dielectrics on compressively strained-Si0.74Ge0.26/Si heterolayers | 2004 |
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Dr Rajat Mahapatra
| Temperature dependent electrical properties of plasma grown gate oxides on tensile strained Si0.993C0.007 layers | 2004 |
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Dr Rajat Mahapatra
| Ultrathin HfO2 gate dielectrics on partially strain compensated SiGeC/Si heterostructure | 2004 |
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Dr Rajat Mahapatra
| Characteristics of ultrathin HfO2 gate dielectrics on strained-Si0.74Ge0.26 layers | 2003 |
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Dr Rajat Mahapatra
| Effects of interfacial nitrogen on the structural and electrical properties of ultrathin ZrO2 gate dielectrics on partially-strain- compensated SiGeC/Si heterolayers | 2003 |
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Dr Rajat Mahapatra
| Electrical and interfacial characteristics of ultrathin ZrO2 gate dielectrics on strain compensated SiGeC/Si heterostructure | 2003 |
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Dr Rajat Mahapatra
| Microwave plasma oxidation of gallium nitride | 2003 |
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Dr Rajat Mahapatra
| Structural and electrical characteristics of the interfacial layer of ultrathin ZrO2 films on partially strain compensated Si0.69Ge0.3C0.01 layers | 2003 |
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Dr Rajat Mahapatra
| Electrical properties of plasma grown gate oxides on tensile strained Si1-yCy alloy | 2002 |
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