ePrints

Measurement of Relaxation in Strained Silicon by Grazing Incidence In-plane X-ray Diffraction

Lookup NU author(s): Dr Sarah Olsen, Professor Anthony O'Neill

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Lafford TA, Olsen SH, Tanner BK, O'Neill AG

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name:

Year of Conference: 2004

Share