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Analysis of gate leakage characteristics in strained Si MOSFETs

Lookup NU author(s): Liang Yan, Dr Sarah Olsen, Dr Mehdi Kanoun, Rimoon Agaiby, Goutan Dalapati, Professor Anthony O'Neill


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Publication metadata

Author(s): Yan L, Olsen S, Kanoun M, Al-Araimi M, Agaiby R, Dalapati G, O'Neill A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 210th ECS Meeting

Year of Conference: 2006

Publisher: The Electrochemical Society


Notes: Abstract 1501