Toggle Main Menu Toggle Search

Open Access padlockePrints

Analysis of Gate Leakage in Strained Si MOSFETs

Lookup NU author(s): Liang Yan, Dr Sarah Olsen, Dr Mehdi Kanoun, Rimoon Agaiby, Goutan Dalapati, Professor Anthony O'Neill

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


Publication metadata

Author(s): Yan L, Olsen SH, Kanoun M, AlAraimi M, Agaiby R, Dalapati GK, ONeill AG

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: SiGe and Ge: Materials, Processing, and Devices - 210th Electrochemical Society Meeting

Year of Conference: 2006

Pages: 1001-1012

ISSN: 1938-5862

Publisher: The Electrochemical Society

URL: http://dx.doi.org/10.1149/1.2355894

DOI: 10.1149/1.2355894

Library holdings: Search Newcastle University Library for this item

ISBN: 19386737


Share