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High temperature operation of silicon carbide Schottky diodes with recoverable avalanche breakdown

Lookup NU author(s): Dr Konstantin Vasilevskiy, Irina Nikitina, Dr Alton Horsfall, Professor Nick Wright, Professor Anthony O'Neill, Dr Christopher Johnson

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Abstract

4H-SiC diodes with nickel suicide (Ni2Si) and molybdenum (Mo) Schottky contacts have been fabricated and characterised at temperature up to 400°C. Room temperature boron implantation has been used to form a single zone junction termination extension. Both Ni2Si and Mo diodes revealed unchanging ideality factors and barrier heights (1.45 and 1.3 eV, respectively) at temperatures up to 400°C Soft recoverable breakdowns were observed both in Ni2Si and Mo Schottky diodes at voltages above 1450 V and 3400 V depending on the epitaxial structure used. These values are about 76% and 94% of the ideal avalanche breakdown voltages. The Ni2Si diodes revealed positive temperature coefficients of breakdown voltage at temperature up to 240°C.


Publication metadata

Author(s): Vassilevski K, Nikitina I, Bhatnagar P, Horsfall A, Wright N, O'Neill AG, Uren M, Hilton K, Munday A, Hydes A, Johnson CM

Editor(s): Devaty, RP; Larkin, DJ; Saddow, SE

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Materials Science Forum

Year of Conference: 2006

Pages: 931-934

ISSN: 0255-5476 (print) 1422-6375 (online)

Publisher: Trans Tech Publications Ltd.

URL: http://dx.doi.org/10.4028/www.scientific.net/MSF.527-529.931

DOI: 10.4028/www.scientific.net/MSF.527-529.931

Notes: Silicon Carbide and Related Materials 2005

Library holdings: Search Newcastle University Library for this item

ISBN: 9780878494255


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