Nor Za'bah
Dr Kelvin Kwa
Professor Anthony O'Neill
| Electrical characterisation of highly doped triangular silicon nanowires | 2014 |
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Nor Za'bah
Dr Kelvin Kwa
Professor Anthony O'Neill
| The study on the aspect ratio of Atomic Force Microscope (AFM) measurements for triangular silicon nanowire | 2013 |
|
Nor Za'bah
Dr Kelvin Kwa
Professor Anthony O'Neill
| Top-down fabrication of single crystal silicon nanowire using optical lithography | 2012 |
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