ePrints

Assessment of strained silicon/SiGe with different architectures by Raman spectroscopy

Lookup NU author(s): Professor Steve BullORCiD, Dr Piotr Dobrosz, Dr Sarah Olsen, Professor Anthony O'Neill

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Bull SJ, Dobrosz P, Olsen SH, O'Neill AG

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Proceedings of Electronic Materials Conference

Year of Conference: 2005

Share