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Assessment of strained silicon/SiGe with different architectures by Raman spectroscopy

Lookup NU author(s): Professor Steve BullORCiD, Dr Piotr Dobrosz, Dr Sarah Olsen, Professor Anthony O'Neill


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Publication metadata

Author(s): Bull SJ, Dobrosz P, Olsen SH, O'Neill AG

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: Proceedings of Electronic Materials Conference

Year of Conference: 2005