Publications by Dr Piotr Dobrosz - ePrints

Browsing publications by Dr Piotr Dobrosz.

Newcastle Authors	Title	Year
Dr Piotr Dobrosz Dr Sarah Olsen	Silicon nanowires with lateral uniaxial tensile stress profiles for high electron mobility gate-all-around MOSFETs	2010
Dr Piotr Dobrosz Dr Sarah Olsen	Silicon nanowires with lateral uniaxial tensile stress profiles for high electron mobility gate-all-around MOSFETs	2010
Dr Piotr Dobrosz Dr Sarah Olsen	The High-Mobility Bended n-Channel Silicon Nanowire Transistor	2010
Dr Piotr Dobrosz Dr Sarah Olsen	Investigation of oxidation-induced strain in a top-down Si nanowire platform	2009
Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	Optimization of the channel lateral strain profile for improved performance of multi-gate MOSFETs	2009
Lisa Sanderson Dr Piotr Dobrosz Dr Sarah Olsen Professor Steve Bull	Tip enhanced Raman spectroscopy for high resolution assessment of strained silicon devices	2009
Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	Investigation of Strain Profile Optimization in gate-all-around suspended silicon nanowire FET	2008
Rouzet Agaiby Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill et al.	Nanometer Scale Strain Profiling Through Si-SiGe Heterolayers	2008
Rouzet Agaiby Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill et al.	Nanometer strain profiling through Si/SiGe quantum layers	2008
Dr Sarah Olsen Dr Piotr Dobrosz Rouzet Agaiby Dr Yuk Tsang Layi Alatise et al.	Nanoscale strain characterisation for ultimate CMOS and beyond	2008
Dr Sarah Olsen Dr Piotr Dobrosz Rouzet Agaiby Dr Yuk Tsang Layi Alatise et al.	Nanoscale strain characterisation for ultimate CMOS and beyond	2008
Dr Piotr Dobrosz Dr Sarah Olsen Professor Steve Bull Dr Yuk Tsang Rouzet Agaiby et al.	Nanoscale strain characterisation in patterned SSOI structures	2008
Dr Sarah Olsen John Varzgar Dr Enrique Escobedo-Cousin Rouzet Agaiby Dr Piotr Dobrosz et al.	Strain engineering for high mobility channels	2008
Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	Bended gate-all-around nanowire MOSFET: A device with enhanced carrier mobility due to oxidation-induced tensile stress	2007
Professor Anthony O'Neill Dr Sarah Olsen Dr Yuk Tsang Dr Piotr Dobrosz	Evolution of strain engineering for Si technology	2007
Dr Enrique Escobedo-Cousin Dr Sarah Olsen Professor Anthony O'Neill Layi Alatise Rouzet Agaiby et al.	Strained Si/strained SiGe/relaxed SiGe structures: identifying roughness due to compressed SiGe and its impact on high mobility MOSFETs	2007
Dr Enrique Escobedo-Cousin Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill et al.	Thermal stability of supercritical thickness-strained Si layers on thin strain-relaxed buffers	2007
Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rimoon Agaiby Dr Johan Seger et al.	Control of self-heating in thin virtual substrate strained Si MOSFETs	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Yuk Tsang Dr Piotr Dobrosz	Evolution of strain engineering for Si technology	2006
Goutan Dalapati Dr Sanatan Chattopadhyay Dr Kelvin Kwa Dr Sarah Olsen Dr Yuk Tsang et al.	Impact of strained-Si thickness and Ge out-diffusion on gate oxide quality for strained-Si surface channel n-MOSFETs	2006
Dr Sarah Olsen Dr Piotr Dobrosz Dr Enrique Escobedo-Cousin Rouzet Agaiby Rimoon Agaiby et al.	Strain characterisation in advanced Si devices	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rimoon Agaiby et al.	Strained Si MOSFETs using thin virtual substrates	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rimoon Agaiby et al.	Strained Si technology	2006
Professor Anthony O'Neill Dr Sarah Olsen Dr Enrique Escobedo-Cousin John Varzgar Rouzet Agaiby et al.	Strained silicon technology	2006
Dr Sarah Olsen Dr Piotr Dobrosz Professor Steve Bull Professor Anthony O'Neill	The relationship between strain generation and relaxation, composition and electrical performance in strained Si/SiGe MOS technology	2006
Dr Sarah Olsen Professor Steve Bull Dr Piotr Dobrosz Dr Enrique Escobedo-Cousin Rouzet Agaiby et al.	Thermal stability of thin virtual substrates for high performance devices	2006
Professor Steve Bull Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	Assessment of strained silicon/SiGe with different architectures by Raman spectroscopy	2005
Dr Sarah Olsen Dr Piotr Dobrosz Dr Enrique Escobedo-Cousin Professor Steve Bull Professor Anthony O'Neill et al.	Mobility-limiting mechanisms in single and dual channel strained Si/SiGe MOSFETs	2005
Professor Steve Bull Dr Piotr Dobrosz Dr Sarah Olsen Professor Anthony O'Neill	On the relationship between electrical performance and Raman spectroscopic results for strained Si/SiGe devices	2005
Dr Sarah Olsen Professor Anthony O'Neill Dr Piotr Dobrosz Professor Steve Bull Luke Driscoll et al.	Study of strain relaxation in Si/SiGe metal-oxide-semiconductor field-effect transistors	2005
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	The use of Raman spectroscopy to identify strain and strain relaxation in strained Si/SiGe structures	2005
Lynn Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al.	Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters	2004
Luke Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al.	Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters	2004
Luke Driscoll Dr Sarah Olsen Dr Sanatan Chattopadhyay Professor Anthony O'Neill Dr Kelvin Kwa et al.	Impact of Ge diffusion and wafer cross hatching on strained Si MOSFET electrical parameters	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the residual macro and microstrain in strained Si/SiGe using Raman spectroscopy	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the Residual Macro and Microstrain in Strained Si/SiGe using Raman Spectroscopy Z Metal	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Measurement of the residual strain in strained Si/SiGe using Raman spectroscopy	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Technique for measuring the residual strain in strained Si/SiGe MOSFET structures using Raman spectroscopy	2004
Dr Piotr Dobrosz Professor Steve Bull Dr Sarah Olsen Professor Anthony O'Neill	Technique for measuring the residual strain in strained Si/SiGe MOSFET structures using Raman spectroscopy	2004