Toggle Main Menu Toggle Search

Open Access padlockePrints

Measurement of the residual strain in strained Si/SiGe using Raman spectroscopy

Lookup NU author(s): Dr Piotr Dobrosz, Professor Steve BullORCiD, Dr Sarah Olsen, Professor Anthony O'Neill

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.


Publication metadata

Author(s): Bull SJ; Olsen SH; O'Neill AG; Dobrosz P

Publication type: Article

Publication status: Published

Journal: Zeitschrift fuer Metallkunde

Year: 2004

Volume: 95

Issue: 5

Pages: 340-344

ISSN (print): 0044-3093

Publisher: Carl Hanser Verlag GmbH & Co. KG


Share