Professor Nick Cowern
Dr Nick Bennett
Dr Chihak Ahn
Dr Joo Chul Yoon
| Transfer of Physically-Based Models from Process to Device Simulations: Application to Advanced Strained Si/SiGe MOSFETs | 2010 |
|
Professor Nick Cowern
Dr Nick Bennett
Dr Chihak Ahn
Dr Joo Chul Yoon
| Overlayer stress effects on defect formation in Si and Ge | 2009 |
|
Dr Joo Chul Yoon
| Atomistic Simulations of Epitaxial Regrowth of As-doped Silicon | 2008 |
|
Dr Joo Chul Yoon
| The Normalization Effect of Neutral B0 Meson Asymmetry | 2006 |
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