Toggle Main Menu Toggle Search

Open Access padlockePrints

Nanometer Scale Strain Profiling Through Si-SiGe Heterolayers

Lookup NU author(s): Rouzet Agaiby, Dr Sarah Olsen, Dr Piotr Dobrosz, Professor Steve BullORCiD, Professor Anthony O'Neill


Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Agaiby RMB, Olsen SH, Dobrosz P, Coulson H, Bull SJ, O'Neill AG

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 50th Electronic Materials Conference (EMC 2008)

Year of Conference: 2008

Publisher: The Minerals, Metals & Materials Society (TMS)